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Modification of the optical and structural properties of ZnO nanowires by low-energy Ar+ ion sputtering

机译:低能Ar +离子溅射修饰ZnO纳米线的光学和结构性质

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摘要

The effects of low-energy (≤2 kV) Ar+ irradiation on the optical and structural properties of zinc oxide (ZnO) nanowires (NWs) grown by a simple and cost-effective low-temperature technique were investigated. Both photoluminescence spectra from ZnO NW-coated films and cathodoluminescence analysis of individual ZnO NWs demonstrated obvious evidences of ultraviolet/visible luminescent enhancement with respect to irradiation fluence. Annihilation of the thinner ZnO NWs after the ion bombardment was appreciated by means of high-resolution scanning electron microscopy and transmission electron microscopy (TEM), which results in an increasing NW mean diameter for increasing irradiation fluences. Corresponding structural analysis by TEM pointed out not only significant changes in the morphology but also in the microstructure of these NWs, revealing certain radiation-sensitive behavior. The possible mechanisms accounting for the decrease of the deep-level emissions in the NWs with the increasing irradiation fluences are discussed according to their structural modifications.
机译:研究了低能(≤2kV)Ar + 辐射对通过简单且经济高效的低温技术生长的氧化锌(ZnO)纳米线(NWs)光学和结构性质的影响。调查。 ZnO NW涂层膜的光致发光光谱和单个ZnO NW的阴极发光分析均显示出明显的紫外线/可见光增强辐照通量的证据。通过高分辨率扫描电子显微镜和透射电子显微镜(TEM)可以观察到离子轰击之后更薄的ZnO NW的灭,这导致NW平均直径的增加,从而增加了辐射通量。 TEM的相应结构分析不仅指出这些NW的形态显着变化,而且还指出其微结构的变化,从而揭示了某些辐射敏感性行为。根据它们的结构变化,讨论了随着辐照通量的增加而减少了西北地区深层排放的可能机制。

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