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Optical Characterization of Strong UV Luminescence Emitted from the Excitonic Edge of Nickel Oxide Nanotowers

机译:氧化镍纳米塔的激子边缘发出的强紫外发光的光学表征

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摘要

NiO had been claimed to have the potential for application in transparent conducting oxide, electrochromic device for light control, and nonvolatile memory device. However, the detailed study of excitonic transition and light-emission property of NiO has rarely been explored to date. In this work, we demonstrate strong exciton-complex emission of high-quality NiO nanotowers grown by hot-filament metal-oxide vapor deposition with photoluminescence as an evaluation tool. Fine and clear emission features coming from the excitonic edge of the NiO are obviously observed in the photoluminescence spectra. A main excitonic emission of ~3.25 eV at 300 K can be decomposed into free exciton, bound excitons, and donor-acceptor-pair irradiations at lowered temperatures down to 10 K. The band-edge excitonic structure for the NiO nanocrystals has been evaluated and analyzed by transmission and thermoreflectacne measurements herein. All the experimental results demonstrate the cubic NiO thin-film nanotower is an applicable direct-band-gap material appropriate for UV luminescence and transparent-conducting-oxide applications.
机译:NiO被认为具有在透明导电氧化物,用于光控制的电致变色器件以及非易失性存储器件中的应用潜力。但是,迄今为止,几乎没有对NiO的激子跃迁和发光性质进行详细研究。在这项工作中,我们展示了通过热丝金属氧化物气相沉积和光致发光作为评估工具而生长的高质量NiO纳米塔的强激子复合物发射。在光致发光光谱中明显观察到来自NiO的激子边缘的精细清晰的发射特征。在低至10 K的温度下,300 K时〜3.25 eV的主要激子发射可分解为自由激子,束缚激子和供体-受体对辐照,已评估了NiO纳米晶体的带边激子结构并通过本文的透射和热反射痤疮测量进行分析。所有的实验结果表明,立方晶NiO薄膜纳米塔是一种适用于直接带隙的材料,适用于UV发光和透明导电氧化物应用。

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