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Energy Bandgap and Edge States in an Epitaxially Grown Graphene/h-BN Heterostructure

机译:外延生长石墨烯/ h-BN异质结构的能带隙和边缘态

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摘要

Securing a semiconducting bandgap is essential for applying graphene layers in switching devices. Theoretical studies have suggested a created bulk bandgap in a graphene layer by introducing an asymmetry between the A and B sub-lattice sites. A recent transport measurement demonstrated the presence of a bandgap in a graphene layer where the asymmetry was introduced by placing a graphene layer on a hexagonal boron nitride (h-BN) substrate. Similar bandgap has been observed in graphene layers on metal substrates by local probe measurements; however, this phenomenon has not been observed in graphene layers on a near-insulating substrate. Here, we present bulk bandgap-like features in a graphene layer epitaxially grown on an h-BN substrate using scanning tunneling spectroscopy. We observed edge states at zigzag edges, edge resonances at armchair edges, and bandgap-like features in the bulk.
机译:确保半导体带隙对于在开关设备中应用石墨烯层至关重要。理论研究表明,通过在A和B子晶格位之间引入不对称性,可以在石墨烯层中形成体带隙。最近的传输测量表明,在石墨烯层中存在带隙,其中通过将石墨烯层放置在六方氮化硼(h-BN)衬底上而引入了不对称性。通过局部探针测量,在金属基底上的石墨烯层中观察到了类似的带隙。但是,在近绝缘基板上的石墨烯层中未观察到该现象。在这里,我们介绍了使用扫描隧道光谱技术在h-BN衬底上外延生长的石墨烯层中的块状带隙特征。我们在锯齿形边缘观察到边缘状态,在扶手椅边缘观察到边缘共振,并在主体中观察到带隙状特征。

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