首页> 外文学位 >Electronic 1/f Noise in h-BN-Graphene- h-BN and High Breakdown Current Density in h-BN-TaSe 3 van der Waals Heterostructures.
【24h】

Electronic 1/f Noise in h-BN-Graphene- h-BN and High Breakdown Current Density in h-BN-TaSe 3 van der Waals Heterostructures.

机译:h-BN-石墨烯-h-BN中的1 / f电子噪声和h-BN-TaSe 3 van der Waals异质结构中的高击穿电流密度。

获取原文
获取原文并翻译 | 示例

摘要

In the first part of the manuscript we have investigated low-frequency 1/f noise in the boron nitride -- graphene -- boron nitride heterostructure field-effect transistors on Si/SiO2 substrates (f is a frequency). The device channel was implemented with a single layer graphene encased between two layers of hexagonal boron nitride. The transistors had the charge carrier mobility in the range from ~30000 to ~36000 cm2/Vs at room temperature. It was established that the noise spectral density normalized to the channel area in such devices can be suppressed to ~5 x 10-9 mum2 Hz-1 , which is a factor of ~5 - ~10 lower than that in non-encapsulated graphene devices on Si/SiO2. The physical mechanism of noise suppression was attributed to screening of the charge carriers in the channel from traps in SiO2 gate dielectric and surface defects. The obtained results are important for the electronic and optoelectronic applications of graphene. In the second part of this work we report on the current-carrying capacity of the nanowires made from the quasi-1D van der Waals metal tantalum triselenide capped with quasi-2D boron nitride. The chemical vapor transport method followed by chemical and mechanical exfoliation was used to fabricate the mm-long TaSe3 wires with the lateral dimensions in the 20 to 70 nm range. Electrical measurements establish that the TaSe3/h-BN nanowire heterostructures have a breakdown current density exceeding 10 MA/cm2 --- an order-of-magnitude higher than that for copper. Some devices exhibited an intriguing step-like breakdown, which can be explained by the atomic thread bundle structure of the nanowires. The quasi-1D single crystal nature of TaSe3 results in a low surface roughness and in the absence of the grain boundaries. These features can potentially enable the downscaling of the nanowires to the lateral dimensions in a few-nm range. Our results suggest that quasi-1D van der Waals metals have potential for applications in the ultimately downscaled local interconnects.
机译:在手稿的第一部分中,我们研究了Si / SiO2衬底上的氮化硼-石墨烯-氮化硼异质结场效应晶体管(f为频率)中的低频1 / f噪声。器件通道由包裹在两层六方氮化硼之间的单层石墨烯实现。在室温下,晶体管的载流子迁移率在〜30000至〜36000 cm2 / Vs的范围内。可以确定的是,在此类器件中归一化为沟道面积的噪声频谱密度可以抑制到〜5 x 10-9 mum2 Hz-1,这比未封装的石墨烯器件的噪声谱密度低〜5-〜10。在Si / SiO 2上。噪声抑制的物理机制归因于从SiO2栅极电介质中的陷阱和表面缺陷中筛选出沟道中的载流子。所得结果对于石墨烯的电子和光电应用很重要。在这项工作的第二部分中,我们报告了由准1D范德华力金属硒化三硒化钽包覆准2D氮化硼制成的纳米线的载流能力。化学汽相输送方法,然后进行化学和机械剥离,用于制造横向尺寸在20至70 nm范围内的毫米长的TaSe3线。电学测量表明,TaSe3 / h-BN纳米线异质结构的击穿电流密度超过10 MA / cm2-比铜高一个数量级。一些设备表现出令人感兴趣的阶梯状击穿,这可以通过纳米线的原子线束结构来解释。 TaSe3的准一维单晶性质导致较低的表面粗糙度和不存在晶界的情况。这些特征可以潜在地使纳米线的尺寸缩小到几纳米范围内的横向尺寸。我们的结果表明,准1D范德华金属在最终缩小规模的本地互连中具有应用潜力。

著录项

  • 作者

    Stolyarov, Maxim.;

  • 作者单位

    University of California, Riverside.;

  • 授予单位 University of California, Riverside.;
  • 学科 Electrical engineering.;Nanotechnology.;Nanoscience.
  • 学位 Ph.D.
  • 年度 2018
  • 页码 95 p.
  • 总页数 95
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号