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Hysteretic photochromic switching of Eu-Mg defects in GaN links the shallow transient and deep ground states of the Mg acceptor

机译:GaN中Eu-Mg缺陷的迟滞光致变色开关链接了Mg受体的浅瞬态和深基态

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摘要

Although p-type activation of GaN by Mg underpins a mature commercial technology, the nature of the Mg acceptor in GaN is still controversial. Here, we use implanted Eu as a ‘spectator ion’ to probe the lattice location of Mg in doubly doped GaN(Mg):Eu. Photoluminescence spectroscopy of this material exemplifies hysteretic photochromic switching (HPS) between two configurations, Eu0 and Eu1(Mg), of the same Eu-Mg defect, with a hyperbolic time dependence on ‘switchdown’ from Eu0 to Eu1(Mg). The sample temperature and the incident light intensity at 355 nm tune the characteristic switching time over several orders of magnitude, from less than a second at 12.5 K, ~100 mW/cm2 to (an estimated) several hours at 50 K, 1 mW/cm2. Linking the distinct Eu-Mg defect configurations with the shallow transient and deep ground states of the Mg acceptor in the Lany-Zunger model, we determine the energy barrier between the states to be 27.7(4) meV, in good agreement with the predictions of theory. The experimental results further suggest that at low temperatures holes in deep ground states are localized on N atoms axially bonded to Mg acceptors.
机译:尽管通过Mg对GaN进行p型活化为成熟的商业技术奠定了基础,但GaN中Mg受体的性质仍存在争议。在这里,我们使用注入的Eu作为“旁观者离子”,以探测Mg在双掺杂GaN(Mg):Eu中的晶格位置。这种材料的光致发光光谱法举例说明了具有相同Eu-Mg缺陷的两种配置Eu0和Eu1(Mg)之间的磁滞光致变色切换(HPS),其中双曲线时间取决于从Eu0到Eu1(Mg)的“转换”。样品温度和355 nm处的入射光强度将特性切换时间调整了几个数量级,从12.5 K不到一秒钟的时间,约100 mW / cm 2 到(估计的)数个在50 K,1 mW / cm 2 的时间将不同的Eu-Mg缺陷构型与Lany-Zunger模型中Mg受体的浅瞬态和深基态联系起来,我们确定这些状态之间的能垒为27.7(4)meV,与对理论。实验结果进一步表明,在低温下,处于深基态的空穴位于与镁受体轴向键合的N原子上。

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