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Priorities for Standards and Measurements to Accelerate Innovations in Nano-Electrotechnologies: Analysis of the NIST-Energetics-IEC TC 113 Survey

机译:加快纳米电气技术创新的标准和测量重点:对NIST-Energytics-IEC TC 113调查的分析

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摘要

In 2008, the National Institute of Standards and Technology and Energetics Incorporated collaborated with the International Electrotechnical Commission Technical Committee 113 (IEC TC 113) on nano-electrotechnologies to survey members of the international nanotechnologies community about priorities for standards and measurements to accelerate innovations in nano-electrotechnologies. In this paper, we analyze the 459 survey responses from 45 countries as one means to begin building a consensus on a framework leading to nano-electrotechnologies standards development by standards organizations and national measurement institutes. The distributions of priority rankings from all 459 respondents are such that there are perceived distinctions with statistical confidence between the relative international priorities for the several items ranked in each of the following five Survey category types: 1) Nano-electrotechnology Properties, 2) Nano-electrotechnology Taxonomy: Products, 3) Nano-electrotechnology Taxonomy: Cross-Cutting Technologies, 4) IEC General Discipline Areas, and 5) Stages of the Linear Economic Model. The global consensus prioritizations for ranked items in the above five category types suggest that the IEC TC 113 should focus initially on standards and measurements for electronic and electrical properties of sensors and fabrication tools that support performance assessments of nano-technology enabled sub-assemblies used in energy, medical, and computer products.
机译:在2008年,美国国家标准技术与能源研究院与国际电工委员会技术委员会113(IEC TC 113)就纳米电子技术进行了合作,以调查国际纳米技术界成员关于标准和测量的优先级,以加速纳米技术的创新。 -电子技术。在本文中,我们分析了来自45个国家的459项调查回复,以此作为开始就框架达成共识的一种方法,该框架促使标准组织和国家测量机构制定了纳米电子技术标准。来自所有459个受访者的优先级排名分布情况使得,在以下五种调查类别中的每种类别中,若干项的相对国际优先级之间存在统计学上的置信度差异:1)纳米电子技术属性,2)纳米-电子技术分类:产品; 3)纳米电子技术分类:交叉切割技术; 4)IEC一般学科领域; 5)线性经济模型的阶段。对于以上五类类别中的排名项目的全球共识优先级排序表明,IEC TC 113首先应关注传感器和制造工具的电子和电气特性的标准和测量,以支持对用于纳米技术的子组件进行性能评估。能源,医疗和计算机产品。

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