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DC Microplasma Jet for Local a:C-H Deposition Operated in SEM Chamber

机译:在SEM室中进行局部a:C-H沉积的直流微等离子体射流

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摘要

A DC micro plasma jet for local micro deposition of a:C-H film in the ambient vacuum of scanning electron microscope (SEM) chamber is proposed. Acetylene (C2H2) gas was locally fed into the chamber through an orifice shaped gas nozzle (OGN) at 6.6 sccm in flow rate by applying 80 kPa-inlet pressure with an additional direct pumping system equipped on the SEM chamber. As a cathode, a cut of n-type silicon (Si) wafer was placed right in front of the OGN at 200 μm gap distance. By applying a positive DC voltage to the OGN, C2H2 plasma was generated locally between the electrodes. During discharge, the voltage increased and the current decreased due to deposition of insulating film on the Si wafer with resulting in automatic termination of discharge at the constant source voltage. A symmetric mountain-shaped a:C-H film of 5 μm height was deposited at the center by operation for 15 s. Films were deposited with variation of gas flow rate, gap distance, voltage and current, and deposition time. The films were directly observed by SEM and analyzed by surface profiler and by Raman spectroscopy.
机译:提出了一种用于在扫描电子显微镜(SEM)室的环境真空中局部微沉积a:C-H膜的直流微等离子体射流。乙炔(C2H2)气体通过孔口形气体喷嘴(OGN)以6.6 sccm的流速通过在SEM室上配备一个额外的直接泵送系统施加80 kPa的入口压力而局部进料到该室中。作为阴极,将n型硅(Si)晶片的切口放在OGN的正前方,间距为200μm。通过向OGN施加正DC电压,在电极之间局部产生C2H2等离子体。在放电过程中,由于绝缘膜在Si晶片上的沉积,电压增加而电流减小,导致在恒定电源电压下自动终止放电。通过操作15 s在中心沉积5μm高的对称山形a:C-H膜。沉积膜时会改变气体流速,间隙距离,电压和电流以及沉积时间。通过SEM直接观察膜,并通过表面轮廓仪和拉曼光谱分析。

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