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Electronicand Chemical Properties of a Surface-TerminatedScrew Dislocation in MgO

机译:电子端基的化学性质MgO中的螺丝脱位

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摘要

Dislocations represent an important and ubiquitous class of topological defect found at the surfaces of metal oxide materials. They are thought to influence processes as diverse as crystal growth, corrosion, charge trapping, luminescence, molecular adsorption, and catalytic activity; however, their electronic and chemical properties remain poorly understood. Here, through a detailed first-principles investigation into the properties of a surface-terminated screw dislocation in MgO we provide atomistic insight into these issues. We show that surface dislocations can exhibit intriguing electron trapping properties which are important for understanding the chemical and electronic characteristics of oxide surfaces. The results presented in this article taken together with recent experimental reports show that surface dislocations can be equally as important as more commonly considered surface defects, such as steps, kinks, and vacancies, but are now just beginning to be understood.
机译:位错代表在金属氧化物材料表面发现的重要且普遍存在的一类拓扑缺陷。人们认为它们会影响晶体生长,腐蚀,电荷俘获,发光,分子吸附和催化活性等过程。然而,它们的电子和化学性质仍然知之甚少。在这里,通过对MgO中表面终止的螺钉错位的特性进行详细的第一性原理研究,我们提供了对这些问题的原子洞察力。我们表明,表面位错可以表现出有趣的电子俘获特性,这对于理解氧化物表面的化学和电子特性很重要。本文提供的结果以及最近的实验报告表明,表面位错与更常见的表面缺陷(例如台阶,扭结和空位)同等重要,但现在才刚刚被人们理解。

著录项

  • 期刊名称 ACS AuthorChoice
  • 作者

    Keith P. McKenna; *;

  • 作者单位
  • 年(卷),期 -1(135),50
  • 年度 -1
  • 页码 18859–18865
  • 总页数 7
  • 原文格式 PDF
  • 正文语种
  • 中图分类
  • 关键词

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