首页> 中文期刊> 《真空与低温》 >电子/质子综合辐照带通滤光片的性能退化机理研究

电子/质子综合辐照带通滤光片的性能退化机理研究

         

摘要

As the life of the spacescraft increased from five years to more than eight years,the longer that optical film suffered from the radiation of space charged particles,the easier for optical film to get damaged. Therefore,it is necessary to continue to improve the requirements to the capacity and anti-radiation performance of optical film. In this article,the radiation of proton and electrons experiment of bandpass filter has been made. Research the deterioration of bandpass filter which is under the radiation of proton and electrons. Analysis the micro-mechanism of the bandpass filter irradiation dam-age based on the XPS and AFM surface analysis technique. Provide bandpass filter space adaptability with a basic research, at the same time,some advice for further improvement of bandpass filter’s design was given.%随着航天器的寿命从5年增加到8年以上,光学薄膜在空间飞行中经受的带电粒子辐照时间更长,光学薄膜更容易受到损伤,因此对光学薄膜抗辐射性能要求也不断提高。开展了光学薄膜带通滤光片电子/质子综合辐照实验,研究电子/质子综合辐照作用下带通滤光片的性能退化规律,借助于XPS和AFM等表面分析技术对带通滤光片微观分析,研究带通滤光片在电子/质子综合辐照下的退化机理。为带通滤光片空间适应性研究提供基础,同时为带通滤光片工艺设计与可靠性提供技术支撑。

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