Transistor level SCA-resistant scheme based on fluctuating power logic

著录项

• 来源
  《中国科学》|2017年第10期|P.266-268|共3页
• 作者

  Liang GENG1; Fan ZHANG12; Jizhong SHEN1; Wei HE3; Shivam BHASIN3; Xinjie ZHAO4; Shize GUO4;

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• 作者单位

  [1]College of Information Science and Electronic Engineering, Zhejiang University, Hangzhou 310027, China [2]Science and Technology on Communication Security Laboratory, Chengdu 610041, China [3]Temasek Laboratories, Nanyang Technological University, Singapore 637371, Singapore [4]The Institute of North Electronic Equipment, Beijing 100191, China;

  [1]College of Information Science and Electronic Engineering, Zhejiang University, Hangzhou 310027, China [2]Science and Technology on Communication Security Laboratory, Chengdu 610041, China [3]Temasek Laboratories, Nanyang Technological University, Singapore 637371, Singapore [4]The Institute of North Electronic Equipment, Beijing 100191, China;

  [1]College of Information Science and Electronic Engineering, Zhejiang University, Hangzhou 310027, China [2]Science and Technology on Communication Security Laboratory, Chengdu 610041, China [3]Temasek Laboratories, Nanyang Technological University, Singapore 637371, Singapore [4]The Institute of North Electronic Equipment, Beijing 100191, China;

  [1]College of Information Science and Electronic Engineering, Zhejiang University, Hangzhou 310027, China [2]Science and Technology on Communication Security Laboratory, Chengdu 610041, China [3]Temasek Laboratories, Nanyang Technological University, Singapore 637371, Singapore [4]The Institute of North Electronic Equipment, Beijing 100191, China;

  [1]College of Information Science and Electronic Engineering, Zhejiang University, Hangzhou 310027, China [2]Science and Technology on Communication Security Laboratory, Chengdu 610041, China [3]Temasek Laboratories, Nanyang Technological University, Singapore 637371, Singapore [4]The Institute of North Electronic Equipment, Beijing 100191, China;

  [1]College of Information Science and Electronic Engineering, Zhejiang University, Hangzhou 310027, China [2]Science and Technology on Communication Security Laboratory, Chengdu 610041, China [3]Temasek Laboratories, Nanyang Technological University, Singapore 637371, Singapore [4]The Institute of North Electronic Equipment, Beijing 100191, China;

  [1]College of Information Science and Electronic Engineering, Zhejiang University, Hangzhou 310027, China [2]Science and Technology on Communication Security Laboratory, Chengdu 610041, China [3]Temasek Laboratories, Nanyang Technological University, Singapore 637371, Singapore [4]The Institute of North Electronic Equipment, Beijing 100191, China;

  [1]College of Information Science and Electronic Engineering, Zhejiang University, Hangzhou 310027, China [2]Science and Technology on Communication Security Laboratory, Chengdu 610041, China [3]Temasek Laboratories, Nanyang Technological University, Singapore 637371, Singapore [4]The Institute of North Electronic Equipment, Beijing 100191, China;

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• 原文格式 PDF
• 正文语种 CHI
• 中图分类 TS943.714;
• 关键词

  SCA 晶体管 逻辑 功率 波动;

• 入库时间 2023-07-24 18:24:15