离子束截面抛光-电子探针仪分析在SiCp/Al复合材料相结构研究中的应用

摘要

There are difficulties in sample preparation and microstructure characterization of SiC particles reinforced Al-based (SiCp/Al) composite due to the complexity of phase constitutes and large difference in physical and chemical properties of the constituted phases.Ion beam cross-sectional polishing (CP) combined with electron probe microanalysis (EPMA) was successfully applied to characterize the detailed microstructure of SiCp/Al composite.The experimental results show that this method is effective,and the results are visual and reliable.The method was thus proven to be applicable to study the phase constitutes of the materials with a similar character.%SiC颗粒增强铝基复合材料(SiCp/Al),由于其结构复杂且各组成单元之间的物理、化学性质存在明显的差异,因而在试样制备、微观结构表征等工作中存在一定困难.利用离子束截面抛光(CP)制样技术结合电子探针X射线分析仪(EPMA)分析,提出了一种适宜解析这种复合材料微观相结构的方法.试验结果证实:该方法效果明显,结果直观、可靠;并可推广到类似材料的微观结构精细解析研究中.