原子力显微镜的研究型教学实验设计探讨

摘要

The basic principle of atomic force microscopy and its extensive use were briefly introduced,and the necessity and significance of the relevant experiment of atomic force microscopy in University Physics Experi-ment course was presented,combining the experience in teaching and research. The suggestions as to open the relevant experiments of atomic force microscopy in University Physics Experiment course were pointed out. Fi-nally,by means of analyzing the surface morphology of semiconductor film,the concrete application of atomic force microscopy in experiment teaching of University Physics Experiment was described.%本文简要介绍了原子力显微镜的基本工作原理及其应用，阐述了在大学物理实验课程中开设原子力显微镜有关实验的必要性和重要意义，结合作者本人在教学和科研方面的经验，指出了在大学物理实验课中开设原子力显微镜有关实验的设计。最后，以分析半导体薄膜的形貌特性为例，探讨了原子力显微镜在大学物理实验课中的具体应用。