Visualization and manipulation of nanoscale components in the field of nanotechnology has many applications including bottom-up nanomanufacturing and the manipulation of DNA and viruses, prototyping of single electron transistors, and characterization and monitoring of Micro-Electro-Mechanical Systems (MEMS) and semiconductors. Scanning probe microscopy tools including the scanning tunneling microscope (STM) and the Atomic Force Microscope (AFM) provide the tools for visualization and manipulation of these nanoscale materials. Scanning probe microscopes have been expensive and were used mainly by research universities and high tech industries. However, due to the increasing need for STM/AFM tools for teaching purposes, leading manufacturers of STM/AFM instruments have developed lower cost, high-value scanning probe microscopes with more user-friendly interfaces for student use. Developing new learning facilities and forging collaboration between different academic institutions and industry will lead to new curricula which will help train a knowledgeable workforce with suitable background to meet the demand of nanotechnology based industries. The purpose of our paper is to discuss the results of establishing an instructional lab for the visualization and manipulation of nanoscale components using low cost AFMs for two and four year engineering technology programs. Development of an interdisciplinary minor in nanotechnology will also be discussed. This effort is supported through the National Science Foundation under the Course Curriculum Laboratory Improvement (CCLI) program.
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