能否准确对精密光学元件表面评价势必影响着光学元件研制与生产，其中中频误差的提取逐渐显得重要。提出了利用双树复小波变换( DT－CWT)对精密光学元件表面提取信号进行多尺度分解，以定义的均方根波长确定其双树复小波分解次数，进行中频误差的提取与识别。此方法应用于精磨和镀膜的精密光学元件表面中，实验证实该方法不仅可以应用于一维信号的提取，同样也适合三维表面中频波段面形误差的提取。%The ability to evaluate the precision optical component surface accurately is bound to affect the development and produc-tion of optical components, more and more attention is paid to researching on the intermediate-frequency surface shape error. This paper uses the dual tree complex wavelet transform ( DT -CWT) to proceed a multi-scale decomposition of a signal extracted from the precision optical component surface, applies the defined root-mean-square wavelength to determining the number of dual tree complex wavelet decomposition. lt conduct the intermediate-frequency error extraction and recognition. This method is applied to fine-grinding and coating precision optical component surfaces, and the experiment proves this method not only can be applied to one di-mensional signal extraction, but also suitable for the extraction of 3-D medium frequency band surface shape error.
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