3-巯基丙基三乙氧基硅烷自组装膜摩擦学性质研究

摘要

3-mercaptopropyltrimethoxysilane(MPTS)thin films deposited on silicon wafer were prepared by self-assembly technique. The chemical composite of films were characterized by X-ray photoelectron spectroscopy( XPS) ,the contact angles of ultra-pure water on the MPTS films were determined with JC200PC contact angle meter. Atomic force microscope ( AFM) was employed to study the morphology of the prepared films. The results show that the contact angle increases at first, then decreases, and increases again as assembling time increasing. The wear resistance is related with the contact angle of film, which is improved with the contact angle increasing.%利用自组装技术将3-巯基丙基三乙氧基硅烷薄膜沉积在单面抛光的单晶硅基片上.用X射线光电子能谱仪测量薄膜的化学成分;用原子力显微镜(AFM)观察薄膜表面形貌;用接触角测量仪测量薄膜的接触角;在摩擦试验机上考察薄膜的摩擦学性能与接触角之间的关系.结果表明:薄膜的接触角随着组装时间的增加先增加后减小然后再增加,表明MM分子在单晶硅基片上的自组装是逐层进行的,当MM完成一层组装时,其薄膜表面自由能较低,所表现出的接触角较大;薄膜的摩擦磨损性能与接触角成对应关系,接触角增大,摩擦因数减小,抗磨损能力提高.