一种新的胚胎电子细胞阵列测试结构

摘要

In embryonics array,testing architecture and the fault detection and location method are limit-ed by the electronic cell structure and the array structure.Fault detection and location capability need to be improved,and the hardware consumption of the testing architecture is large.In order to solve these problems, a novel testing architecture composed of configurable boundary scan architecture and configurable inner scan architecture was proposed.Based on this novel architecture,a register transfer level fault detection method and a cell level fault location method were proposed.In the simulation of s27 circuit,the detailed process of fault detection and location is introduced,and the hardware resource consumption of the testing architecture is ana-lyzed.Simulation and analysis results show that the proposed method can effectively detect and locate the fault at cell level,and the proportion of hardware resource consumption of the testing architecture decreases signifi -cantly as the size of the embryonics array increases,which is suitable for large-scale embryonics array.%针对胚胎电子细胞阵列中测试结构与故障检测和定位方法受电子细胞和阵列结构限制较大,故障检测和定位能力有限,硬件消耗大等问题,提出一种由可配置边界扫描结构和可配置内部扫描结构组成的新的测试结构.基于这种测试结构,提出了寄存器传输级故障检测和细胞级故障定位相结合的故障检测和定位方法.仿真实验以s27电路为例,详细介绍了故障检测和定位的具体过程并对测试结构的硬件消耗进行了分析.仿真和分析结果表明,本文方法可有效检测并在细胞级定位故障,而且随着阵列规模增大,测试结构的硬件消耗所占比例明显下降,适用于大规模胚胎电子细胞阵列.