2003年IEEE国际可靠性物理年会论文集论文摘要(5)

摘要

@@ 2003年IEEE国际可靠性物理年会论文集论文74.超薄氧化中击穿传导路径的缺陷生成引发磨损的证据(Evidence for Defect-Generation-DrivenWear-out of Breakdown Conduction Path in UltraThin Oxides)-2003 International ReliabilityPhysics Symposium pp.424-431.