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Effects of doping, cation stoichiometry, and the processing conditions on the dielectric properties of high-K calcium copper titanate ceramics.

机译:掺杂,阳离子化学计量和加工条件对高K钛酸铜铜陶瓷的介电性能的影响。

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摘要

Since its discovery, the anomalous dielectric behavior of CaCu3 Ti4O12 (CCTO) has drawn a great deal of attention for many possible applications in electronic devices. The origin of the giant dielectric constant in CCTO was explained via an internal barrier layer capacitor model, and it has been reported that the dielectric properties of CCTO are sensitive to its microstructure which depends upon the processing conditions. To further explore its unusual dielectric phenomena, the current study focuses on the process-property-structure relationship of the high-K CCTO via doping, cation non-stoichiometry, and sintering conditions.;A variety of CCTO pellets were obtained by utilizing the different processing parameters via conventional solid-state synthesis methods. For the doping study, three types of dopants were selected with the variation of doping concentration. The study of undoped CCTO ceramics was carried out by the modification of the CuO and TiO2 content in CCTO to create the stoichiometric formula CaCu3+xTi4+yO12 (x = -0.06, 0, -0.06; y = 0.08, 0, -0.08). Different processing factors including heating and cooling rates, sintering temperature, and sintering time were applied for the study of stoichiometric CCTO. X-ray diffraction, dielectric measurements, impedance spectroscopy, thermal analysis, and electron microprobe analysis were used to determine the existence of CuO and Cu2O secondary phases, dielectric constant and loss tangent, electrical resistivity of grains and boundaries, decomposition reactions, and the microstructural changes of CCTO ceramics.;It was revealed that the doping method improved the dielectric constant and loss tangent. The similar improvement in dielectric properties was also found in the Cu-deficient and Ti-deficient CCTO. The measurement and characterization results of stoichiometric CCTO clearly indicated that the dielectric properties, evolution of secondary phases, and microstructures were strongly dependent upon the processing parameters. Further, CCTO became Cu-deficient and Ti-excessive regardless of sintering conditions, which provides evidence for its complex behavior created by the reduction/oxidation reactions and the defect chemistry.
机译:自发现以来,CaCu3 Ti4O12(CCTO)的异常介电行为已引起电子设备中许多可能应用的广泛关注。 CCTO中巨大的介电常数的起源是通过内部势垒层电容器模型解释的,据报道,CCTO的介电特性对其微观结构敏感,这取决于加工条件。为了进一步探索其不寻常的介电现象,目前的研究重点是通过掺杂,阳离子非化学计量和烧结条件来研究高K CCTO的工艺-性能-结构关系。通过常规固态合成方法处理参数。对于掺杂研究,根据掺杂浓度的变化选择了三种类型的掺杂剂。通过修改CCTO中的CuO和TiO2含量以创建化学计量公式CaCu3 + xTi4 + yO12(x = -0.06,0,-0.06; y = 0.08,0,-0.08)来进行未掺杂CCTO陶瓷的研究。 。包括加热和冷却速率,烧结温度和烧结时间在内的不同工艺因素被用于化学计量CCTO的研究。使用X射线衍射,介电测量,阻抗谱,热分析和电子微探针分析来确定CuO和Cu2O二次相的存在,介电常数和损耗角正切,晶粒和边界的电阻率,分解反应以及微观结构揭示了掺杂方法改善了介电常数和损耗角正切。在缺铜和缺钛的CCTO中也发现了类似的介电性能改善。化学计量CCTO的测量和表征结果清楚地表明,介电性能,次级相的演变和微观结构在很大程度上取决于加工参数。此外,CCTO不论烧结条件如何,都变为Cu缺乏和Ti过多,这为其还原/氧化反应和缺陷化学所产生的复杂行为提供了证据。

著录项

  • 作者

    Kwon, Seunghwa.;

  • 作者单位

    Oregon State University.;

  • 授予单位 Oregon State University.;
  • 学科 Engineering Materials Science.
  • 学位 Ph.D.
  • 年度 2008
  • 页码 161 p.
  • 总页数 161
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 工程材料学;
  • 关键词

  • 入库时间 2022-08-17 11:38:41

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