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Insights from scanning transmission electron microscopy and x-ray diffraction into the structure and composition of non-crystalline thin solid films

机译：从扫描透射电子显微镜和X射线衍射到非晶薄固体膜的结构和组合物中的见解

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作者
Mitchson, Gavin Andersen.;
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作者单位

University of Oregon.;

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授予单位 University of Oregon.;
学科
学位 Ph.D.
年度 2016
页码 300 p.
总页数 300
原文格式 PDF
正文语种 eng
中图分类 AAI10240080;
关键词
Amorphous metal oxides; Materials characterization; Scanning transmission electron microscopy; Semiconductors; Thin films; X-ray diffraction;

机译：无定形金属氧化物;材料表征;扫描透射电子显微镜;半导体;薄膜;X射线衍射;

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Insights from scanning transmission electron microscopy and x-ray diffraction into the structure and composition of non-crystalline thin solid films

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