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Designing, modeling, manufacturing, and testing an atomic layer deposition system.

机译:设计,建模,制造和测试原子层沉积系统。

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摘要

There are multiple techniques for depositing thin films in nanoelectronics and semiconductor industries. Of the many techniques, chemical deposition is the most favorable since materials can be deposited in high aspect ratios and give full coverage across uneven surfaces. However the most conventional technique in chemical deposition, named chemical vapor deposition (CVD), has some limiting properties like high temperature and uncontrollable film growth. To have the advantage of chemical deposition and also being able to control film growth in monolayer resolution, a new technique has been introduced, named Atomic Layer Deposition (ALD). This technique gives a very good control on layer-by-layer film growth. It can work at low temperatures and high pressures. In manufacturing nanoantennas and MIM diodes there is a need, for having an ultra thin film with full coverage across select areas. ALD is a promising solution for ultra-thin film fabrication problems. In this work we designed, modeled, manufactured, and tested a novel ALD system. Our system is designed to do more exotic film depositions than the small-range accessible with industrially available ALDs.;A typical ALD process starts with entraining a precursor in a carrier gas that brings it inside the reactor where it adsorbs on the substrate's surface. The second step is removing the extra precursor from the chamber by purging it. The third step is adding another precursor gas to the reactor. The two precursors will react with each other on the substrate's surface. In the fourth step a purge is used to remove excessive precursors and by-products from the reactor chamber. A well-designed reactor for this process needs to have the ability to operate under high vacuum, high temperatures, and intense reactions. In the designed reactor within this project, a showerhead, a stage heater, a ceramic spacer, and stage holder were designed and manufactured. There are four gas inlets from a top flange that feed into showerhead, which helps better gas dispersion. Also in the showerhead each of the inlets can be used to bring different gases inside the reactor for CVD processes. The designed reactor is a cross reactor, which minimizes the gas entrapment. All the flanges were designed in a way to have good ability to control the system.;The tubing in this system is used to bring precursors inside the reactor. To have a good control on the flow rate of precursors, individual mass flow controllers, i.e. four ALD Solenoid Valves, are used to regulate the flow of each precursor. Bubblers are used to contain precursors at the entry point of the gas delivery line. Each bubbler has a dipping tube that extends the length of the bubbler container to give the carrier gas the ability to entrain precursors and bring them inside reactor. ALD Valve-4 is designed in a way that can switch the system from ALD to CVD. This gives us the ability to have multiple depositions in different techniques in a single run. ALD Valve-3 is designed for vacuum bubblers in case there is a precursor with very low volatility or very sensitive to high temperatures.;Controlling the entire system, all at the same time, is crucial to the success of ALD. The parameters that needed to be controlled are temperature, pressure, gas flow, and each of the ALD Valves. There are five parts in the designed system that have separate thermocouples and heaters. Each of bubblers, tubings, the reaction chamber's body, and substrate stage can get to a separate temperature using PID controllers. Finally a box designed for all the PID controllers and relays to read all the temperatures side-by-side. In addition, there is a terminal box that connects all the tubings' heaters and chamber heaters together. Low vacuum pressure can be read by either of the two thermocouple gauges installed on the system. One of the thermocouple gauges reads the pressure of the reaction chamber and the other reads the pressure inside turbopump. To control gas flow and ALD Valves, a software program was developed that can send digital signals to DAQ cards and the cards can change it to analog signal and send to MFCs and Valves. A control box is designed that contains all the four DAQ cards and a circuit that gives us the ability to control the valves by low currents.;Finally the manufactured ALD was tested for process of depositing Al2O3 on top of silicon substrate. The test were performed in two batches, EDS test were performed to prove the deposition of Al2O3 also AFM test showed very flat films with 1.2 nm RMS were fabricated. The results of tests ensured the ability of the ALD to deposit films. (Abstract shortened by ProQuest.).
机译:在纳米电子和半导体工业中,有多种沉积薄膜的技术。在许多技术中,化学沉积是最有利的,因为可以高纵横比沉积材料并在不平坦的表面上完全覆盖。但是,化学沉积中最传统的技术称为化学气相沉积(CVD),具有某些局限性,例如高温和无法控制的膜生长。为了具有化学沉积的优点并且还能够以单层分辨率控制膜的生长,已引入了一种称为原子层沉积(ALD)的新技术。此技术可很好地控制逐层膜的生长。它可以在低温和高压下工作。在制造纳米天线和MIM二极管时,需要具有在选定区域完全覆盖的超薄膜。 ALD是解决超薄膜制造问题的有前途的解决方案。在这项工作中,我们设计,建模,制造和测试了新型ALD系统。我们的系统被设计为比工业上可得到的ALD进行小范围的沉积更多的异质膜沉积。典型的ALD工艺始于将前驱物夹带在载气中,该前驱物将前驱物带入反应器内部,并吸附在基质表面上。第二步是通过清除腔室中多余的前驱物。第三步是向反应器中加入另一种前体气体。两种前体将在基材表面相互反应。在第四步中,使用吹扫从反应器腔室中去除过量的前体和副产物。设计良好的反应器​​必须具有在高真空,高温和剧烈反应下运行的能力。在该项目的设计反应堆中,设计并制造了一个喷头,一个载物台加热器,一个陶瓷垫片和一个载物台支架。顶部法兰上有四个进气口,它们进入喷头,有助于更好地分散气体。同样在喷淋头中,每个入口都可用于将不同的气体引入反应器内部进行CVD工艺。设计的反应器是交叉反应器,可最大程度地减少气体截留。所有法兰的设计方式均具有良好的控制系统的能力。该系统中的管道用于将前驱物带入反应器。为了对前驱物的流量进行良好的控制,使用单独的质量流量控制器(即四个ALD电磁阀)来调节每种前驱物的流量。起泡器用于在气体输送管线的入口处容纳前体。每个起泡器都有一个浸入管,该管延长了起泡器容器的长度,使载气有能力夹带前驱物并将其带入反应器。 ALD Valve-4的设计可以将系统从ALD切换到CVD。这使我们能够在一次运行中以不同的技术进行多次沉积。 ALD Valve-3是为真空起泡器而设计的,以防前体具有极低的挥发性或对高温非常敏感。同时控制整个系统对于ALD的成功至关重要。需要控制的参数是温度,压力,气体流量和每个ALD阀。设计系统中有五个部分,分别具有独立的热电偶和加热器。可以使用PID控制器将起泡器,管道,反应室的主体和底物台分别加热到单独的温度。最后,为所有PID控制器和继电器设计的盒子可以并排读取所有温度。另外,还有一个接线盒,将所有管道的加热器和室内加热器连接在一起。可以通过系统上安装的两个热电偶压力表之一来读取低真空压力。一个热电偶压力表读取反应室的压力,另一个读取涡轮泵内部的压力。为了控制气体流量和ALD阀门,开发了一个软件程序,该程序可以将数字信号发送到DAQ卡,并且卡可以将其更改为模拟信号并发送到MFC和阀门。设计了一个控制盒,其中包含所有四个DAQ卡和一个使我们能够通过低电流控制阀的电路。最后,对制造的ALD进行了测试,以将Al2O3沉积在硅基板上。测试分两批进行,进行EDS测试以证明Al2O3的沉积,AFM测试表明制得的平整膜具有1.2 nm RMS。测试结果确保了ALD沉积膜的能力。 (摘要由ProQuest缩短。)。

著录项

  • 作者

    Makarem, Mohamadamin.;

  • 作者单位

    University of Missouri - Columbia.;

  • 授予单位 University of Missouri - Columbia.;
  • 学科 Chemical engineering.
  • 学位 M.S.
  • 年度 2015
  • 页码 96 p.
  • 总页数 96
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

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