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Kinetic study on the production of silicon nitride by direct nitridation of silicon in a fluidized bed: Experiment and modeling.

机译:在流化床中通过直接氮化硅生产氮化硅的动力学研究:实验和建模。

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Direct nitridation of porous silicon pellets {dollar}(dsb{lcub}p{rcub}{dollar} {dollar}sim{dollar} 400 {dollar}murm m){dollar} composed of fine grains {dollar}(dsb{lcub}g,m{rcub}{dollar} {dollar}sim{dollar} 2 {dollar}murm m){dollar} was performed in a fluidized bed reactor (55 mm ID) using nitrogen (30-90%) - hydrogen (5-50%) - argon mixtures as the nitriding gas in the temperature range 1200-{dollar}1390spcircrm C.{dollar} The effects of reaction temperature, hydrogen, nitrogen and pretreatment of raw materials on the nitridation of silicon and the yields of {dollar}alpha{dollar}- and {dollar}beta{dollar}-form were investigated. It was shown that a high silicon conversion (99%) and a high {dollar}alpha /beta{dollar} ratio ({dollar}sim{dollar}10) in the produced silicon nitride can be achieved by controlling the reaction temperature and the content of nitriding atmosphere.; Nitridation is initiated after an induction period which becomes shorter with an increase in reaction temperature and/or nitrogen concentration, but is unaffected by hydrogen. Both the final conversion of silicon and {dollar}alpha /beta{dollar} ratio increase with an increase in reaction temperature and/or with a decrease in nitrogen concentration, but remain essentially unaffected by hydrogen.; The mechanism of nitridation remains unclear. The most reasonable assumption for it, based on TEM photos of reacting pellets, is that the process is controlled by the nitrogen transport through the crackling, polycrystalline nitride layer, with nitride crystallites detaching from the silicon surface after reaching a critical thickness, so fresh silicon surface is exposed. A mathematical model developed on the basis of this assumption, applied to the conversion of a single grain, predicted the critical nitride layer thickness in agreement with experimental observations.; Modeling was also applied to nitridation of grains having a wide size distribution, in which case the effective silicon surface area was shown to reasonably linearly decrease with an increase in the overall conversion. The assumption of a constant average silicon consumption rate per this area led to a correlation which predicts the progress of nitridation in a wide range of experimental conditions. The results show that the average nitridation rate per the effective surface area obeys a first order rate law with respect to nitrogen and that the process has an apparent activation energy of {dollar}sim{dollar}340 kJ/mol in the temperature range 1200-{dollar}1300spcircrm C.{dollar}
机译:多孔硅颗粒的直接氮化{dollar}(dsb {lcub} p {rcub} {dollar} {dollar} sim {dollar} 400 {dollar} murm m){dollar}由细晶粒{dollar}(dsb {lcub}组成g,m {rcub} {dollar} {dollar} sim {dollar} 2 {dollar} murm m){dollar}在流化床反应器(55 mm内径)中使用氮气(30-90%)-氢气(5 -50%)-氩气混合物在1200- {dollar} 1390spcircrm C. {dollar}温度范围内作为氮化气体。反应温度,氢气,氮气和原料预处理对硅的氮化和{调查了美元}α{美元}-和{美元}β{美元}的形式。结果表明,通过控制反应温度和反应温度,可以使制得的氮化硅具有较高的硅转化率(99%)和较高的{alpha} /β{dollar}比({sim} {dollar} 10)。氮化气氛的含量。在诱导期后开始进行氮化,诱导期随着反应温度和/或氮浓度的增加而变短,但不受氢的影响。硅的最终转化率和{α} /β{美元}的比率都随着反应温度的升高和/或氮浓度的降低而增加,但基本上不受氢的影响。氮化的机理尚不清楚。基于反应丸的TEM照片,最合理的假设是该过程受氮气通过裂化多晶氮化物层的传输控制,氮化物微晶达到临界厚度后会从硅表面分离,因此,新鲜硅表面暴露。在此假设的基础上建立的数学模型适用于单个晶粒的转化,与实验观察结果一致,预测了临界氮化物层的厚度。模型化还应用于具有宽尺寸分布的晶粒的氮化,在这种情况下,有效硅表面积显示为随着总转化率的增加而合理地线性减小。每个面积上平均硅消耗速率恒定的假设导致了一种相关性,该相关性预测了各种实验条件下氮化的进展。结果表明,相对于氮,每有效表面积的平均氮化速率遵循一阶速率定律,并且该过程在1200-200°C的温度范围内具有340 kJ / mol的表观活化能。 {dollar} 1300spcircrm C. {dollar}

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