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Nanofabrication of self-assembled monolayers: Advanced methodologies and applications.

机译:自组装单分子层的纳米加工:先进的方法和应用。

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We developed advanced scanning probe lithography (ASPL) methodologies for the nanometer-scale fabrication of thiol self-assembled monolayers (SAMs). First, we studied the stability of SAMs in the conditions under which they are fabricated.; Second, we developed a new multimode scanning probe microscope capable of automated scanning probe lithography. Complex nanostructures, including large arrays and nanodevice-like patterns, were fabricated.; Third, we systematically studied the influence of two fabrication parameters (the force applied by the tip and its speed during fabrication) on the resolution during AFM-based nanofabrication. Patterning imperfections induced by the piezoelectric scanner, the AFM cantilever and the feedback electronics were also described, and possible remedies suggested.; Fourth, we investigated the formation of a partial thiol-containing bilayer on top of SAMs in contact with highly concentrated thiol solutions. The following formation mechanism was proposed: (i) the matrix SAM rapidly exchanged with thiols in solution; (ii) protruding alkyl chains anchored a physisorbed thiol-containing monolayer on top of the SAM; (iii) hydrophobic forces drove the formation of a (partial) reverse bilayer film. Partial bilayer formation is not observed on nanopatterns fabricated in the SAM matrix. Thus, it might serve as a nanopattern transfer method. The bilayer deposition selectivity is attributed to differences in surface order between the pattern area and the surrounding exchanged SAM.
机译:我们开发了用于纳米级硫醇自组装单层(SAMs)纳米制造的高级扫描探针光刻(ASPL)方法。首先,我们研究了SAM在制造条件下的稳定性。其次,我们开发了一种能够自动扫描探针光刻的新型多模扫描探针显微镜。制造复杂的纳米结构,包括大型阵列和类似纳米器件的图案。第三,我们系统地研究了两个制造参数(尖端施加的力及其在制造过程中的速度)对基于AFM的纳米制造过程中分辨率的影响。还描述了由压电扫描仪,AFM悬臂和反馈电子设备引起的图案缺陷,并提出了可能的解决方法。第四,我们研究了在与高浓度硫醇溶液接触的SAM上方形成部分含硫醇的双层。提出了以下形成机理:(i)基质SAM与溶液中的硫醇快速交换; (ii)突出的烷基链锚定在SAM顶部的物理吸附的含硫醇单层; (iii)疏水力推动了(部分)反向双层薄膜的形成。在SAM矩阵中制作的纳米图案上未观察到部分双层形成。因此,它可以用作纳米图案转移方法。双层沉积选择性归因于图案区域与周围交换的SAM之间的表面顺序差异。

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