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Ferromagnetism in manganese doped indium antimonide semiconductor thin films grown by metalorganic vapor phase epitaxy.

机译:金属有机气相外延生长锰掺杂的锑化铟铟半导体薄膜中的铁磁性。

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摘要

The InMnSb magnetic alloy system was developed for its potential application as a room temperature spintronic device material. Epitaxial In1-xMn xSb films were deposited using atmospheric pressure metal-organic vapor phase epitaxy on InSb(001) and InAs(001) substrates. Films are nominally single phase and epitaxial as determined by x-ray diffraction. The lattice constant of the film decreased with increasing Mn concentration. The films are compositionally homogenous on the nanometer size scale as determined by high resolution transmission electron microscopy measurements.;Extended x-ray absorption fine structure analysis indicates that the Mn substitutes for In with tetrahedral site-symmetry. InMnSb film shows local order consisting of clusters of five manganese atoms where the average distance between two clusters is 2.1 nm. X-ray absorption near edge spectroscopy and x-ray absorption spectroscopy studies indicate a highly localized Mn 2+ ion with a 3d5 ground state electronic configuration. Room temperature x-ray magnetic circular dichroism measurements indicate a net spin polarization of the carriers.;The films exhibit room temperature ferromagnetism as determined by superconducting quantum interference device magnetometry. Reversible field cooled and zero field cooled magnetization curves indicate the homogenous nature of ferromagnetism in the films. The Curie temperature of (In,Mn)Sb thin films is 580 K. Films are p-type semiconductors, with carrier concentration ranging from 5x1018 cm-3 - 2.3x1020 cm -3. Room temperature anomalous Hall effect is observed supporting a carrier-mediated ferromagnetic mechanism.
机译:InMnSb磁性合金系统是作为室温自旋电子器件材料的潜在应用而开发的。外延In1-xMn xSb薄膜是使用大气压金属有机气相外延在InSb(001)和InAs(001)衬底上沉积的。薄膜名义上是单相的,通过X射线衍射确定是外延的。膜的晶格常数随着Mn浓度的增加而降低。如通过高分辨率透射电子显微镜测量所确定的,膜在纳米尺寸尺度上是组成均匀的。扩展的x射线吸收精细结构分析表明,Mn以四面体位点对称性代替In。 InMnSb薄膜显示出由五个锰原子簇组成的局部顺序,其中两个簇之间的平均距离为2.1 nm。 X射线吸收近边缘光谱和X射线吸收光谱研究表明,具有3d5基态电子构型的高度局限性Mn 2+离子。室温X射线磁性圆二向色性测量表明载流子的净自旋极化。薄膜表现出室温铁磁性,这是通过超导量子干涉仪磁力测定法确定的。可逆磁场冷却和零磁场冷却的磁化曲线表明了薄膜中铁磁性的均质性。 (In,Mn)Sb薄膜的居里温度为580K。薄膜是p型半导体,载流子浓度范围为5x1018 cm-3-2.3x1020 cm -3。观察到室温异常霍尔效应支持载体介导的铁磁机制。

著录项

  • 作者

    Parashar, Nidhi D.;

  • 作者单位

    Northwestern University.;

  • 授予单位 Northwestern University.;
  • 学科 Engineering Materials Science.
  • 学位 Ph.D.
  • 年度 2010
  • 页码 229 p.
  • 总页数 229
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

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