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Fabrication and Characterization of Optoelectronics Devices Based on III-V Materials for Infrared Applications by Molecular Beam Epitaxy.

机译:基于分子束外延的用于红外应用的基于III-V材料的光电器件的制造和表征。

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摘要

Optoelectronic devices based on III-V materials operating in infrared wavelength range have been attracting intensive research effort due to their applications in optical communication, remote sensing, spectroscopy, and environmental monitoring. The novel semiconductor lasers and photodetectors structures and materials investigated in this thesis cover the spectral range from 1.3µm to 12µm. This spectral region includes near-infrared (NIR), mid-infrared (MIR) and long wavelength infrared.;This thesis demonstrated infrared optoelectronic devices, based on III-V compound semiconductors grown by Molecular Beam Epitaxy (MBE), utilizing various combinations of novel III-V materials, device structures and substrate orientations.;This thesis will be presented in two parts; the first part focuses on two types of photodetectors; type-II InAs/GaSb superlattice IR detector and AlGaAsSb/InGaAsSb mid-infrared heterojunction p-i-n photodetector. The second part of this thesis focuses on the three types of quantum well (QW) lasers; phosphor-free1.3µm InAlGaAs strain-compensated multiple-quantum-well (SCMQW) lasers on InP (100), InGaAsNSb/GaAs quantum wells (QWs) grown on GaAs (411)A substrates and mid-infrared InGaAsSb lasers with digitally grown tensile-strained AlGaAsSb barriers.;Type-II InAs/GaSb superlattice IR detectors with various spectral ranges were grown by MBE. Two superlattice structures with 15 monolayers (ML) of InAs/12ML GaSb and 17ML InAs/7ML GaSb are discussed. Based on X-ray diffraction (XRD) measurements both InAs/GaSb superlattices exhibit excellent material qualities with the full width at half maximum (FWHM) of the 0th-order peak about 20arcsec, which is among the narrowest ever reported. The 50% cutoff wavelengths at 80K of the two photodiodes with 15ML InAs/12ML GaSb and 17ML InAs/7ML GaSb superlattices are measured to be 10.2µm and 6.6µm, respectively.;Mid-infrared heterojunction p-i-n photodetector, AlGaAsSb/InGaAsSb lattice-matched to GaSb grown by solid source molecular beam epitaxy using As and Sb valved crackers greatly facilitated the lattice-matching of the quaternary InGaAsSb absorbing layer to the GaSb substrates, as characterized by X-ray diffraction. The resulting device exhibited low dark current and a breakdown voltage of 32V at room temperature. A record Johnson-noise-limited detectivity of 9.0 × 1010 cm Hz½/W was achieved at 290K. The 50% cutoff wavelength of the device was 2.57 µm. Thus, our result has clearly demonstrated the potential of very high-performance lattice-matched InGaAsSb p–i–n photodetectors for mid-infrared wavelengths.;For phosphor-free1.3 µm InAlGaAs multiple-quantum-well (MQW) lasers, the substrate temperature has been found to be a critical growth parameter for lattice-matched InAl(Ga)As layers in the laser structures. As shown by X-ray diffraction measurements, in the temperature range of 485–520° C, spontaneously ordered superlattices (SLs) with periods around 7–10 nm were formed in the bulk InAl(Ga)As layers. Based on photoluminescence (PL) measurements, a large band gap reduction of 300 meV and a broadened PL peak were observed for the In0.52 Al0.48As layers with SL, as compared to those without SL. The undesirable, spontaneously-ordered SL can be avoided by using MBE growth temperatures higher than 530 °C. This results in a high laser performance. Threshold-current density as low as 690 A/cm2 and T0 as high as 80 K were achieved for InAlGaAs laser bars emitting at 1310 nm.;InGaAsNSb/GaAs QWs on GaAs (411)A exhibited remarkably enhanced photoluminescence efficiency compared with the same structures on conventional GaAs (100) substrates. It was further observed that the optimum growth temperature for (411)A was 30 °C higher than that for (100). To explain this phenomenon, a model based on the self-assembling of local rough surface domains into a unique global smooth surface at the lowest energy state of the system is proposed.;Lastly, the digital-growth approach for tensile-strained AlGaAsSb barriers improved the reliability and controllability of MBE growth for the MQW active region in the mid-infrared InGaAsSb quantum well lasers. The optical and structural qualities of InGaAsSb MQW were improved significantly, as compared to those with random-alloy barriers due to the removal of growth interruption at the barrier/well interfaces in digital growth. As a result, high-performance devices were achieved in the InGaAsSb lasers with digital AlGaAsSb barriers. A low threshold current density of 163 A/cm2 at room temperature was achieved for 1000-µm-long lasers emitting at 2.38 µm. An external differential quantum efficiency as high as 61% was achieved for the 880-µm-long lasers, the highest ever reported for any lasers in this wavelength range.
机译:由于其在光通信,遥感,光谱学和环境监测中的应用,基于在红外波长范围内工作的III-V材料的光电设备已引起了广泛的研究努力。本文研究的新型半导体激光器和光电探测器的结构和材料涵盖了从1.3μm到12μm的光谱范围。该光谱区域包括近红外(NIR),中红外(MIR)和长波长红外。本文证明了基于分子束外延(MBE)生长的III-V型化合物半导体的红外光电器件,利用了多种组合新颖的III-V族材料,器件结构和衬底取向。第一部分着眼于两种类型的光电探测器。 II型InAs / GaSb超晶格红外探测器和AlGaAsSb / InGaAsSb中红外异质结p-i-n光电探测器。本文的第二部分着眼于三种类型的量子阱(QW)激光器。在InP(100)上生长的无磷1.3μmInAlGaAs应变补偿多量子阱(SCMQW)激光器,在GaAs(411)A衬底上生长的InGaAsNSb / GaAs量子阱(QW)和具有数字生长张力的InInGaAsSb激光器MBE生长了具有各种光谱范围的II型InAs / GaSb超晶格红外探测器。讨论了具有15个InAs / 12ML GaSb和17ML InAs / 7ML GaSb单层(ML)的两个超晶格结构。根据X射线衍射(XRD)测量,InAs / GaSb超晶格均显示出优异的材料质量,其0阶峰的半峰全宽(FWHM)约为20弧秒,这是有史以来最窄的峰。具有15ML InAs / 12ML GaSb和17ML InAs / 7ML GaSb超晶格的两个光电二极管在80K时的50%截止波长分别为10.2μm和6.6μm.;中红外异质结引脚光电探测器AlGaAsSb / InGaAsSb晶格匹配通过X射线衍射表征,使用As和Sb阀裂化器通过固体源分子束外延生长的GaSb对GaSb的催化作用极大地促进了四元InGaAsSb吸收层与GaSb衬底的晶格匹配。所得器件在室温下表现出低的暗电流和32V的击穿电压。在290K时达到创纪录的9.0×1010 cm Hz1 / 2 / W的Johnson噪声极限检测率。器件的50%截止波长为2.57μm。因此,我们的结果清楚地证明了非常高性能的晶格匹配InGaAsSb p–i–n光电探测器对于中红外波长的潜力。对于无磷的1.3 µm InAlGaAs多量子阱(MQW)激光器,已经发现衬底温度是激光结构中晶格匹配的InAl(Ga)As层的关键生长参数。如X射线衍射测量所示,在485–520°C的温度范围内,块状InAl(Ga)As层中形成了周期约为7–10 nm的自发有序超晶格(SLs)。根据光致发光(PL)测量,与不带SL的In0.52 Al0.48As层相比,观察到带SL的In0.52 Al0.48As层带隙减小了300 meV,并且PL峰变宽。通过使用高于530°C的MBE生长温度,可以避免不良的,自发有序的SL。这导致高的激光性能。在1310 nm处发射的InAlGaAs激光棒的阈值电流密度低至690 A / cm2和T0高达80 K;与相同结构相比,GaAs(411)A上的InGaAsNSb / GaAs QW表现出显着增强的光致发光效率在传统的GaAs(100)衬底上。进一步观察到,(411)A的最佳生长温度比(100)的最佳生长温度高30℃。为了解释这种现象,提出了一种基于局部粗糙表面域自组装到系统最低能量状态的唯一全局光滑表面的模型。最后,改进了拉伸应变AlGaAsSb势垒的数字增长方法中红外InGaAsSb量子阱激光器中MQW有源区MBE生长的可靠性和可控性。与具有随机合金壁垒的InGaAsSb MQW相比,InGaAsSb MQW的光学和结构质量得到了显着改善,这是因为消除了数字生长中壁垒/阱界面处的生长中断。结果,在具有数字AlGaAsSb势垒的InGaAsSb激光器中实现了高性能的器件。对于波长为2.38 µm的1000 µm激光器,室温下的阈值电流密度低至163 A / cm2。长度为880 µm的激光器的外部差分量子效率高达61%,是该波长范围内任何激光器的最高报道。

著录项

  • 作者

    Torfi, Amin.;

  • 作者单位

    Columbia University.;

  • 授予单位 Columbia University.;
  • 学科 Engineering Electronics and Electrical.;Physics Condensed Matter.;Physics Optics.;Engineering Materials Science.
  • 学位 Ph.D.
  • 年度 2012
  • 页码 109 p.
  • 总页数 109
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

  • 入库时间 2022-08-17 11:42:44

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