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Electrical Integration of SiC Power Devices for High-Power-Density Applications

机译:用于高功率密度应用的SiC功率器件的电气集成

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摘要

The trend of electrification in transportation applications has led to the fast development of high-power-density power electronics converters. High-switching-frequency and high-temperature operations are the two key factors towards this target. Both requirements, however, are challenging the fundamental limit of silicon (Si) based devices. The emerging wide-bandgap, silicon carbide (SiC) power devices have become the promising solution to meet these requirements. With these advanced devices, the technology barrier has now moved to the compatible integration technology that can make the best of device capabilities in high-power-density converters. Many challenges are present, and some of the most important issues are explored in this dissertation.;First of all, the high-temperature performances of the commercial SiC MOSFET are evaluated extensively up to 200 °C. The static and switching characterizations show that the device has superior electrical performances under elevated temperatures. Meanwhile, the gate oxide stability of the device -- a known issue to SiC MOSFETs in general -- is also evaluated through both high-temperature gate biasing and gate switching tests. Device degradations are observed from these tests, and a design trade-off between the performance and reliability of the SiC MOSFET is concluded.;To understand the interactions between devices and circuit parasitics, an experimental parametric study is performed to investigate the influences of stray inductances on the MOSFET's switching waveforms. A small-signal model is then developed to explain the parasitic ringing in the frequency domain. From this angle, the ringing mechanism can be understood more easily and deeply. With the use of this model, the effects of DC decoupling capacitors in suppressing the ringing can be further explained in a more straightforward way than the traditional time-domain analysis. A rule of thumb regarding the capacitance selection is also derived.;A Power Electronics Building Block (PEBB) module is then developed with discrete SiC MOSFETs. Integrating the power stage together with the peripheral functions such as gate drive and protection, the PEBB concept allows the converter to be built quickly and reliably by simply connecting several PEBB modules. The high-speed gate drive and power stage layout designs are presented to enable fast and safe switching of the SiC MOSFET. Based on the PEBB platform, the state-of-the-art Si and SiC power MOSFETs are also compared in the device characteristics, temperature influences, and loss distributions in a high-frequency converter, so that special design considerations can be concluded for the SiC MOSFET.;Towards high-temperature, high-frequency and high-power operations, integrated wire-bond phase-leg modules are also developed with SiC MOSFET bare dice. High-temperature packaging materials are carefully selected based on an extensive literature survey. The design considerations of improved substrate layout, laminated bus bars, and embedded decoupling capacitors are all discussed in detail, and are verified through a modeling and simulation approach in the design stage. The 200 °C, 100 kHz continuous operation is demonstrated on the fabricated module. Through the comparison with a commercial SiC phase-leg module designed in the traditional way, it is also shown that the design considerations proposed in this work allow the SiC devices in the wire-bond structure to be switched twice as fast with only one-third of the parasitic ringing.;To further push the performance of SiC power modules, a novel hybrid packaging technology is developed which combines the small parasitics and footprint of a planar module with the easy fabrication of a wire-bond module. The original concept is demonstrated on a high-temperature rectifier module with SiC JFET. A modified structure is then proposed to further improve design flexibility and simplify module fabrication. The SiC MOSFET phase-leg module built in this structure successfully reaches the switching speed limit of the device almost without any parasitic ringing.;Finally, a new switching loop snubber circuit is proposed to damp the parasitic ringing through magnetic coupling without affecting either conduction or switching losses of the device. The concept is analyzed theoretically and verified experimentally. The initial integration of such a circuit into the power module is presented, and possible improvements are proposed.
机译:运输应用中电气化的趋势导致了高功率密度电力电子转换器的快速发展。高开关频率和高温操作是实现此目标的两个关键因素。但是,这两个要求都在挑战基于硅(Si)的设备的基本极限。新兴的宽带隙碳化硅(SiC)功率器件已成为满足这些要求的有前途的解决方案。有了这些先进的设备,技术壁垒现在已转移到兼容的集成技术,该技术可以充分利用高功率密度转换器中的设备功能。本文提出了许多挑战,并探讨了一些最重要的问题。首先,对高达200°C的商用SiC MOSFET的高温性能进行了广泛的评估。静态和开关特性表明,该器件在高温下具有出色的电气性能。同时,器件的栅极氧化物稳定性(通常是SiC MOSFET的已知问题)也通过高温栅极偏置和栅极开关测试进行评估。通过这些测试观察到器件性能下降,并得出了SiC MOSFET的性能和可靠性之间的设计折衷。 MOSFET的开关波形。然后,开发了一个小信号模型来解释频域中的寄生振铃。从这个角度,可以更容易和更深入地了解振铃机构。使用该模型,可以用比传统时域分析更直接的方式进一步解释直流去耦电容器在抑制振铃方面的作用。还得出了有关电容选择的经验法则。然后,采用分立的SiC MOSFET开发了功率电子构建模块(PEBB)模块。通过将功率级与外围功能(如栅极驱动和保护)集成在一起,PEBB概念允许通过简单地连接几个PEBB模块就可以快速,可靠地构建转换器。提出了高速栅极驱动和功率级布局设计,以实现SiC MOSFET的快速安全开关。在PEBB平台的基础上,还比较了最新的Si和SiC功率MOSFET在高频转换器中的器件特性,温度影响和损耗分布,从而可以得出特殊的设计考虑。 SiC MOSFET。针对高温,高频和大功率工作,还开发了带有SiC MOSFET裸片的集成引线键合相脚模块。高温包装材料是根据广泛的文献调查精心选择的。详细讨论了改进的基板布局,叠层母线和嵌入式去耦电容器的设计注意事项,并在设计阶段通过建模和仿真方法进行了验证。在制造的模块上演示了200°C,100 kHz的连续运行。通过与以传统方式设计的商用SiC相支腿模块进行比较,还表明,这项工作中提出的设计考虑因素允许将引线键合结构中的SiC器件切换速度提高了两倍,而只有三分之一为了进一步提高SiC功率模块的性能,开发了一种新颖的混合封装技术,该技术将平面模块的小寄生效应和占位面积与易于制造的引线键合模块结合在一起。最初的概念在带有SiC JFET的高温整流器模块上得到了证明。然后提出一种修改后的结构,以进一步提高设计灵活性并简化模块制造。采用这种结构的SiC MOSFET相脚模块几乎可以成功达到器件的开关速度极限,几乎没有任何寄生振铃。最后,提出了一种新的开关环路缓冲电路,通过磁耦合来抑制寄生振铃而不影响导通或设备的开关损耗。该概念经过理论分析和实验验证。提出了这种电路到电源模块的初始集成,并提出了可能的改进方案。

著录项

  • 作者

    Chen, Zheng.;

  • 作者单位

    Virginia Polytechnic Institute and State University.;

  • 授予单位 Virginia Polytechnic Institute and State University.;
  • 学科 Electrical engineering.
  • 学位 Ph.D.
  • 年度 2013
  • 页码 256 p.
  • 总页数 256
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

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