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High-speed vertical -cavity surface -emitting lasers with reduced electrical and thermal constraints on modulation bandwidth.

机译:高速垂直腔表面发射激光器,在调制带宽上具有减小的电和热约束。

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摘要

High-speed oxide-confined VCSELs were fabricated and characterized. Fabrication processes for top-emitting self-aligned and non-self-aligned 850nm and 980nm as well as for bottom-emitting, non-self-aligned, flip-chip bonded 980nm VCSELs were developed. The effect of heat-sinking on high-speed VCSELs performance was demonstrated for 850nm and 980nm devices.;Two generations of devices were designed, fabricated and characterized. In the first generation, self-aligned top-emitting 850nm high-speed VCSELs were fabricated and characterized. The self-aligned process allowed smaller mesa diameters, decreasing capacitance by 49% and reducing the distance for heat flow to sidewalls. Au-wrapped and Cu-plated heat-spreading layers reduced the thermal resistance (Rth) by 25% and 44%, respectively, and the output power was increased by 17% and 38%, respectively. The fabricated devices exhibited a f3dB of 16.3GHz at 8.9kA/cm 2. Using the second generation design and fabrication process, the effect of improved heat-sinking on the performance of a 10mum active diameter Cu-plated high-speed VCSELs demonstrated a reduction in Rth by up to 57%. The 850nm lasers exhibited a f3dB of ∼18GHz at 8kA/cm 2 and a MCEF of 15GHz/mA1/2.;The effect of heat-sinking on the performance of high-speed, non-self-aligned top-emitting 980nm VCSELs was also demonstrated. Increasing Cu-plated heatsink radii from 0mum to 4mum greater than the mesa in 980nm VCSELs reduced Rth by 50% for top-emitting VCSELs over a range of device sizes. For a 9mum active diameter, the 4mum heatsink increased output power and f3dB by 131% and 40%, respectively. The measured f3dB was 9.8GHz at 10.5kA/cm2.;Bottom-emitting non-self-aligned flip-chip bonded 980nm devices were fabricated and characterized. VCSELs with 10mum active area have a threshold current and a slope efficiency of 0.6mA and 80%, respectively. The flip-chip bonding increased the maximum output power for VCSELs by up to 25%.;The effect of external heating on the VCSELs resonance frequency and damping factor was examined for top-emitting, self-aligned 980nm VCSELs. Increasing temperature reduced the resonance frequency and damping factor, limiting the bandwidth of VCSELs. The damping and resonance frequency relationship revealed a maximum intrinsic bandwidth of 24.7GHz.;Dielectric properties of four different spin-on dielectrics were investigated. The pad capacitance circuit model was obtained based on geometrical and physical considerations.
机译:制作并表征了高速氧化物限制的VCSEL。开发了顶部发射自对准和非自对准850nm和980nm以及底部发射,非自对准,倒装芯片键合980nm VCSEL的制造工艺。证明了散热对850nm和980nm器件的高速VCSEL性能的影响。设计,制造和表征了两代器件。在第一代中,制造并表征了自对准顶部发射的850nm高速VCSEL。自对准过程允许较小的台面直径,将电容减小49%,并减少了热量流向侧壁的距离。镀金和镀铜的散热层分别使热阻(Rth)降低了25%和44%,输出功率分别提高了17%和38%。所制造的器件在8.9kA / cm 2时的f3dB为16.3GHz。使用第二代设计和制造工艺,改进的散热对10mm有效直径镀铜高速VCSEL的性能产生了影响。在Rth中最多可提高57%。 850nm激光器在8kA / cm 2时的f3dB为〜18GHz,MCEF为15GHz / mA1 / 2。散热对高速,非自对准顶部发射980nm VCSEL的性能的影响为也证明了。在980nm VCSEL中,镀铜的散热器半径从台面的0mum增加到4mum,使顶部发射VCSEL在各种器件尺寸下的Rth降低了50%。对于9毫米的有效直径,4毫米的散热器分别增加了131%和40%的输出功率和f3dB。在10.5kA / cm2时测得的f3dB为9.8GHz。制造并表征了底部发射非自对准倒装芯片键合980nm器件。有源区为10的VCSEL的阈值电流和斜率效率分别为0.6mA和80%。倒装芯片键合将VCSEL的最大输出功率提高了25%。;对于顶部发光的自对准980nm VCSEL,研究了外部加热对VCSEL谐振频率和阻尼系数的影响。温度升高会降低谐振频率和阻尼系数,从而限制VCSEL的带宽。阻尼和共振频率之间的关系显示最大固有带宽为24.7GHz。;研究了四种不同的旋涂电介质的介电性能。焊盘电容电路模型是基于几何和物理考虑而获得的。

著录项

  • 作者

    AL-Omari, Ahmad Nasser.;

  • 作者单位

    Colorado State University.;

  • 授予单位 Colorado State University.;
  • 学科 Engineering Electronics and Electrical.
  • 学位 Ph.D.
  • 年度 2006
  • 页码 246 p.
  • 总页数 246
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

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