Recent Progress Toward Single Photon Detection Using Charge Multiplying CCD Image Sensors

摘要

This paper describes recent progress in the technology of low-light level image sensing using CCD image sensors that multiply charge by impact ionization before its conversion into a voltage. The paper presents a brief description of the concept, the outline of a typical sensor design with some important details related to the Dynamic Range (DR), and then focuses primarily on the measurement and analysis of noise components that are important in charge multiplying CCD devices. It is concluded that under suitable conditions it is possible to achieve a Single Photon (electron) Detection (SPD) performance.