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Subpicosecond electro-optic Imaging Using Interferometric And Polarimetric apparatus

机译:使用干涉仪和偏光仪的亚皮秒电光成像

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This communication describes an interferometric and a polarimetric ultrafast electro-optic imager, each capable of imaging the voltage distribution over a rectangular region of an ( opto)electronic device. The detector is a commericial 2-dimensional (2-D) charge-coupled-device (CCD) array having a limited dynamic range. Our analysis focuses on techniques that take advantage of the speed and convenience of a CCD measurement system and overcome the dynamic-range limitations of CCD's. Experimental results obtained with a non-optimized polarimeter having a voltage sensitivity of approx 1.8 V are presented. Theoretical voltage senitivity for an interferometric system is 270 mV.
机译:该通信描述了一种干涉式和偏振式超快电光成像仪,每个成像仪都能对(光电)电子设备矩形区域上的电压分布进行成像。该检测器是具有有限动态范围的商业二维(2-D)电荷耦合器件(CCD)阵列。我们的分析重点是利用CCD测量系统的速度和便利性并克服CCD动态范围限制的技术。呈现了使用电压灵敏度约为1.8 V的非优化旋光仪获得的实验结果。干涉仪系统的理论电压敏感度为270 mV。

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