首页> 外文会议>Applied Power Electronics Conference and Exposition (APEC), 2012 Twenty-Seventh Annual IEEE >1200 V SiC “Super” Junction Transistors operating at 250 °C with extremely low energy losses for power conversion applications
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1200 V SiC “Super” Junction Transistors operating at 250 °C with extremely low energy losses for power conversion applications

机译:1200 V SiC“超级”结晶体管,在250°C的温度下工作,具有极低的能量损耗,适用于功率转换应用

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The electrical performance of GeneSiC''s 1200 V/7 A SiC Super Junction Transistor (SJT) is compared with three best-in-class commercial Si IGBTs in this paper. Low leakage currents of <100 μA at 325 °C, turn-on and turn-off switching transients of <15 ns at 250 °C, current gain as high as 72, on-resistance as low as 235 mΩ, second-breakdown-free square RBSOA, and short-circuit withstand time of 22 μs were measured on the SiC SJTs. For switching 7 A and 800 V at 100 kHz, the SiC SJT + GeneSiC SiC Schottky rectifier as Free Wheeling Diode (FWD) achieved a total power loss reduction of about 64% when compared to the best all-Si IGBT+FWD configuration and a power loss reduction of about 47 %, when compared to the best Si IGBT + SiC Schottky FWD.
机译:本文将GeneSiC的1200 V / 7 A SiC超级结晶体管(SJT)的电气性能与三个同类最佳的商用Si IGBT进行了比较。在325°C时小于100μA的低泄漏电流,在250°C时小于15 ns的导通和关断瞬态,电流增益高达72,导通电阻低至235mΩ,二次击穿在SiC SJT上测得的自由平方RBSOA和短路耐受时间为22μs。与100%最佳全硅IGBT + FWD配置相比,SiC SJT + GeneSiC SiC肖特基整流器作为续流二极管(FWD)能够在100 kHz时切换7 A和800 V,实现了约64%的总功耗降低。与最佳的Si IGBT + SiC肖特基FWD相比,功耗降低了约47%。

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