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Flow Rate's Influence on Low Temperature Silicon Oxide Deposited by Atmospheric Pressure Plasma Jet for Organic Thin Film Transistor Application

机译:流速对常压等离子射流沉积有机硅晶体管用低温氧化硅的影响

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摘要

Organic thin film transistors attracted many researchers and companies to investigate and develop due to their future applications mainly consist of flexible display and flexible electronics. Flexible displays are considered as the revolutionary product because it could be applied for e-paper, e-book, and large area screen which would decrease the use of woods, keep environment, and make our life colorful (1-4). On the other hand, flexible electronics, including ratio frequency identification smart card (RFID) and sensors such as pressure sensor, gas sensor, bio-sensor, and electronic artificial skin (5-6). In recent years, although the performance of OTFTs have great improvement, there are still some issues influencing the development of OTFTs. These issues of OTFTs mainly include low mobility, stability, low temperature and low cost processes and high operation voltage. The mobility of organic thin film transistors is only about 0.001-10 cm~2/V-s, much lower than silicon-base MOSFET and polysilicon TFT. The mobility of OTFTs is dominated by organic material and ordering of organic material (7-8). On the other hand, stability of organic semiconductor material is a serious problem. Electrical characteristics of OTFTs would be degraded by oxygen, moisture, and organic solvent and so on (9-10).
机译:由于有机薄膜晶体管的未来应用主要包括柔性显示器和柔性电子,因此吸引了许多研究人员和公司进行研究和开发。柔性显示器被认为是革命性的产品,因为它可以用于电子纸,电子书和大面积屏幕,这将减少对木材的使用,保持环境,并使我们的生活丰富多彩(1-4)。另一方面,柔性电子设备包括比率频率识别智能卡(RFID)和传感器,例如压力传感器,气体传感器,生物传感器和人造皮肤电子(5-6)。近年来,尽管OTFT的性能有了很大的提高,但是仍然存在一些影响OTFT发展的问题。 OTFT的这些问题主要包括低迁移率,稳定性,低温和低成本工艺以及高工作电压。有机薄膜晶体管的迁移率仅为0.001-10 cm〜2 / V-s,远低于硅基MOSFET和多晶硅TFT。 OTFT的迁移率受有机材料和有机材料的有序性(7-8)支配。另一方面,有机半导体材料的稳定性是一个严重的问题。 OTFT的电特性会因氧气,湿气和有机溶剂等而降低(9-10)。

著录项

  • 来源
    《Thin film transistors 10(TFT 10)》|2010年|p.255-264|共10页
  • 会议地点 Las Vegas NV(US);Las Vegas NV(US)
  • 作者单位

    Department of Electronics Engineering and Institute of Electronic of Nation Chiao-Tung University, Hsin-Chu, Taiwan, Republic of China;

    Department of Electronics Engineering and Institute of Electronic of Nation Chiao-Tung University, Hsin-Chu, Taiwan, Republic of China;

    Department of Electronics Engineering and Institute of Electronic of Nation Chiao-Tung University, Hsin-Chu, Taiwan, Republic of China;

  • 会议组织
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 半导体技术;
  • 关键词

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