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Monte Carlo Study of Kerr Effect in Ni_xSiO_(2(1-x)) granular films

机译:Ni_xSiO_(2(1-x))颗粒薄膜中Kerr效应的蒙特卡洛研究

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Monte Carlo method has been applied to simulate the hysteresis loops from VSM and MOKE measurement for Ni_xSiO_(2(1-x)) granular films. The simulated results reveal that: (1) The calculated Kerr loops are in good agreement with the experimental data. (2) The anisotropy constant decreases with the increasing packing fraction of Ni clusters; (3) Generally, the difference between the hysteresis loops obtained from VSM and Kerr effect respectively always exists for the finite incident angle. It increases with increasing incident angle. It for strong ferromagnetic films is smaller than those for weak or mixed magnetic films.
机译:蒙特卡罗方法已应用于模拟Ni_xSiO_(2(1-x))颗粒薄膜的VSM和MOKE测量的磁滞回线。仿真结果表明:(1)计算的Kerr环与实验数据吻合良好。 (2)各向异性常数随着Ni团簇堆积率的增加而减小; (3)通常,对于有限的入射角,分别从VSM和Kerr效应获得的磁滞回线之间总是存在差异。它随着入射角的增加而增加。对于强铁磁膜,它小于对弱磁膜或混合磁膜。

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