A Memory Built-In Self-Test Architecture for Memories Different in Size

摘要

To reduce the area and developing time of the Memory Built-in Self-Test (MBIST) circuit has been challenged in the market. An architecture that could test memories different in size by only one MBIST circuit is presented in this paper. It is achieved by adding a data processing module and an address processing module into the mature and ready-made MBIST architecture. Base on this architecture, a MBIST circuit for the memories embedded in a SoC chip is successfully designed.