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A 370-MHz Memory Built-In Self-Test State Machine

机译：370 MHz内存内置自检状态机

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R. Dean Adams; John Connor; Garrett S. Koch; Luigi Ternullo;
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2. Built-In Self-Test Methodology With Statistical Analysis for Electrical Diagnosis of Wearout in a Static Random Access Memory Array [J] . Woongrae Kim, Chang-Chih Chen, Dae-Hyun Kim, IEEE transactions on very large scale integration (VLSI) systems . 2016,第7期

机译：内置自测方法和统计分析，用于静态随机存取存储器阵列中的电损耗诊断
3. A Built-in Self-Test Scheme for Memory Interfaces Timing Test and Measurement [J] . Hyun Jin Kim, Jacob A. Abraham Journal of Electronic Testing: Theory and Applications: Theory and Applications . 2012,第5期

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4. A 370-MHz memory built-in self-test state machine [C] . Adams R.D., Connor J., Koch G.S., European Design and Test Conference, 1995. EDTC 1995, Proceedings. . 1995

机译：370 MHz内存内置自检状态机
5. A programmable memory built-in self-test for SRAM. [D] . Chinthala, Nishanth Reddy. 2010

机译：内置可编程存储器，用于SRAM自检。
6. A ΣΔ Closed-Loop Interface for a MEMS Accelerometer with Digital Built-In Self-Test Function [O] . Dongliang Chen, Xiaowei Liu, Liang Yin, 2018

机译：具有数字内置自检功能的MEMS加速度计的ΣΔ闭环接口
7. Immunotronics - novel finite-state-machine architectures with built-in self-test using self-nonself differentiation [O] . Bradley D.W., Tyrrell A.M. 2002

机译：Immunotronics - 新型有限状态机架构，内置自我测试，使用自我非自我差异

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