首页> 外文会议>Symposium on Organic Electronic and Photonic Materials and Devices Nov 27-30, 2000, Boston, Massachusetts, U.S.A. >ENVIRONMENTAL SCANNING ELECTRON MICROSCOPY AS TOOL TO STUDY SHRINKAGE MICROCRACKS IN CEMENT-BASED MATERIALS
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ENVIRONMENTAL SCANNING ELECTRON MICROSCOPY AS TOOL TO STUDY SHRINKAGE MICROCRACKS IN CEMENT-BASED MATERIALS

机译:环境扫描电子显微镜作为研究水泥基材料收缩微裂纹的工具

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摘要

In this paper a method is described to observe shrinkage microcracks on 'wet' specimen cross-sections of cement-based materials with Environmental Scanning Electron Microscopy (ESEM). A sample cooling device which can be used in the ESEM chamber was built to control the relative humidity above a microscope sample. The accuracy of measuring relative humidity is determined to be 5% at a sample temperature of 3℃. A microscope sample preparation method and a pump-down sequence of the ESEM-chamber, both without any drying of the sample, are described. Preliminary results show that in the studied mortar the visibility of shrinkage microcracks on a 'wet' specimen cross-section is low due to closure of microcracks by swelling of the cement paste.
机译:在本文中,描述了一种使用环境扫描电子显微镜(ESEM)观察水泥基材料的“湿”试样横截面上的收缩微裂纹的方法。建立了可在ESEM室中使用的样品冷却装置,以控制显微镜样品上方的相对湿度。在3℃的样品温度下,相对湿度的测量精度确定为5%。描述了在不干燥样品的情况下的显微镜样品制备方法和ESEM腔室的抽空顺序。初步结果表明,在研究的砂浆中,“湿”试样截面上收缩微裂纹的可见性较低,这是由于水泥浆溶胀导致的微裂纹闭合所致。

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