首页> 美国政府科技报告 >Field Emission Gun Scanning Electron Microscopy with Electron Back Scatter Diffraction for Texture, Formability and Fatigue Studies of Advanced Materials; Final rept. 1 May 2005-28 Feb 2007
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Field Emission Gun Scanning Electron Microscopy with Electron Back Scatter Diffraction for Texture, Formability and Fatigue Studies of Advanced Materials; Final rept. 1 May 2005-28 Feb 2007

机译:用于电子背散射衍射的场发射枪扫描电子显微镜用于先进材料的织构,成形性和疲劳研究;最终的评论。 2005年5月1日至2007年2月28日

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An advanced field emission gun scanning electron microscope (FEGSEM Hitachi S-4300) equipped with energy dispersion spectroscopy (EDS PGT Spirit, presently a part of Bruker) and electron back scatter diffraction (EBSD HKL Channel 5, presently a part of Oxford Instruments) was acquired by the support jointly from AFOSR ($250,000) through a DURIP program and the University of Kentucky ($161,365). The FEGSEM-EDS-EBSD system was installed in July 2006 and has been used in one DoD-funded project and two other research projects that are of interest to the Department of Defense, and in materials education at the University of Kentucky.

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