首页> 外文会议>Symposium on Luminescence and Luminescent Materials, Apr 17-19, 2001, San Francisco, California >Chemical mapping of indium rich quantum dots in InGaN/GaN quantum wells
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Chemical mapping of indium rich quantum dots in InGaN/GaN quantum wells

机译:InGaN / GaN量子阱中富铟量子点的化学映射

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Indium clustering in InGaN/GaN multiple quantum wells (MQWs) is believed to be responsible for the high luminescent efficiency of GaN based light emitting diodes. In this paper we show that substantial clustering can be induced by reducing to zero the interruption time between growth of the GaN barrier layer on the InGaN quantum well. Photoluminescence (PL) shows that this has the effect of increasing the luminescence intensity and decreasing the band gap energy (higher indium concentration). The clusters or quantum dots were examined and quantified by energy filtered transmission electron microscopy (EFTEM), which was used to form chemical distribution maps of indium, gallium and nitrogen. In this paper we will show that this technique can accurately calculate the indium concentration and distribution in the quantum wells. The calculations show that In_xGa_(1-x)N quantum dots (width = 1.3nm) exhibit an In concentration of up to x = 0.5, which are embedded in a quantum well matrix with x = 0.05.
机译:InGaN / GaN多量子阱(MQW)中的铟簇被认为是造成GaN基发光二极管高发光效率的原因。在本文中,我们表明,通过将InGaN量子阱上GaN势垒层的生长之间的中断时间减少到零,可以诱导大量的团簇。光致发光(PL)表明,这具有增加发光强度和降低带隙能量(较高的铟浓度)的作用。通过能量过滤透射电子显微镜(EFTEM)对簇或量子点进行检查和定量,该电子显微镜用于形成铟,镓和氮的化学分布图。在本文中,我们将证明该技术可以准确计算量子阱中的铟浓度和分布。计算表明,In_xGa_(1-x)N量子点(宽度= 1.3nm)显示出最高x = 0.5的In浓度,它们被嵌入x = 0.05的量子阱矩阵中。

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