首页> 外文会议>Symposium on II-VI Compound Semiconductor Photovoltaic Materials, Apr 16-20, 2001, San Francisco, California >EFFECT OF CdCl_2 TREATMENT CONDITIONS ON THE DEEP LEVEL DENSITY, CARRIER LIFETIME AND CONVERSION EFFICIENCY OF CdTe THIN FILM SOLAR CELLS
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EFFECT OF CdCl_2 TREATMENT CONDITIONS ON THE DEEP LEVEL DENSITY, CARRIER LIFETIME AND CONVERSION EFFICIENCY OF CdTe THIN FILM SOLAR CELLS

机译:CdCl_2处理条件对CdTe薄膜太阳能电池深层密度,载体寿命和转化效率的影响

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摘要

The effect of CdCl_2 annealing conditions of glass/TCO-CdS/p-CdTe solar cell structures on the deep level density and carrier lifetime of the p-CdTe layer and correlation with the solar cell conversion efficiency was investigated. CdCl_2 treatment was carried out at temperatures ranging from 370 to 460℃ for 15 min. A clear correlation between trap density, carrier lifetime, conversion efficiency and the CdCl_2 annealing conditions was observed. Un-annealed structures had a conversion efficiency of 5.7%, hole trap energy of E_V+0.42eV, hole trap density of 8.71x10~(14)cm~(-3), and decay lifetime of 0.15μs. The optimum CdCl_2 annealing temperature was found to be 415℃ for structures grown at a substrate temperature of 595℃, where the conversion efficiency, hole trap energy, hole trap density, decay lifetime were 13.4%, E_V+0.44eV, 8.10x10~(12) cm~(-3) and 0.40μs, respectively.
机译:研究了玻璃/ TCO / n-CdS / p-CdTe太阳能电池结构的CdCl_2退火条件对p-CdTe层的深能级密度和载流子寿命以及与太阳能电池转换效率的关系。 CdCl_2处理在370至460℃的温度下进行15分钟。观察到阱密度,载流子寿命,转化效率和CdCl_2退火条件之间有明显的相关性。未退火结构的转换效率为5.7%,空穴陷阱能为E_V + 0.42eV,空穴陷阱密度为8.71x10〜(14)cm〜(-3),衰减寿命为0.15μs。对于在595℃的衬底温度下生长的结构,发现最佳的CdCl_2退火温度为415℃,其转化效率,空穴陷阱能,空穴陷阱密度,衰减寿命为13.4%,E_V + 0.44eV,8.10x10〜( 12)cm〜(-3)和0.40μs。

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