首页> 外文会议>Symposium on Advanced Data Storage Materials and Characterization Techniques; 20031201-20031204; Boston,MA; US >Optical Properties of Multi-layer Chalcogenide Thin Film for Optical Recording Media
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Optical Properties of Multi-layer Chalcogenide Thin Film for Optical Recording Media

机译:用于光学记录介质的多层硫族化物薄膜的光学性质

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We present the results of optical properties of multi layer thin films as in the media of phase change optical disk data storage. Reflectance and optical contrast of multi layer thin films increased rapidly between 100 ℃ and 150 ℃. Moreover, optical contrasts at different wavelength were also studied. The refractive index and the optical band gap decreased, while the extinction coefficient increases as the crystallization occurs. The E_g~(opt) of crystalline thin film was ~0.6 eV lower than that of amorphous thin film. E_g~(opt) decreased as the number of stacked layer increased.
机译:我们介绍了在相变光盘数据存储介质中多层薄膜的光学性能的结果。多层薄膜的反射率和光学对比度在100℃至150℃之间迅速增加。此外,还研究了不同波长下的光学对比。折射率和光学带隙减小,而消光系数随着发生结晶而增加。晶体薄膜的E_g〜(opt)比非晶薄膜的E_g〜(opt)低约0.6 eV。随着堆叠层数的增加,E_g〜(opt)减小。

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