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Low Voltage Table-Top Electron Microscopy of Polymer and Organic Molecular Thin Films

机译:聚合物和有机分子薄膜的低压台式电子显微镜

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摘要

There is intense current interest in the use of polymer and organic molecular materials for high technology devices including transistors, biosensors, and actuators (Wuerthner, 2001). In order for these materials to achieve their ultimate potential it is imperative to obtain detailed information about their microstructure, especially in the thin film forms central to technological applications. Our research group has been actively developing techniques for high-resolution electron optical examinations of polymers and organic materials, with particular emphasis on low dose high-resolution electron microscopy (HREM) (Martin, 2000). While this method of examining organic materials' structure has proven to be particularly powerful, current generations of electron microscopes suffer from several problems. They are quite expensive (typically $500k-$1500k), require considerable amounts of space, and are time-consuming and fairly difficult to operate. Furthermore, the high voltages normally used in conventional electron microscopes (200 ― 400 kV) provide little contrast when imaging thin films composed of low atomic number components.
机译:当前,对于包括晶体管,生物传感器和致动器在内的高科技设备使用聚合物和有机分子材料引起了极大的兴趣(Wuerthner,2001)。为了使这些材料发挥最大的潜力,必须获得有关其微观结构的详细信息,尤其是在技术应用中至关重要的薄膜形式中。我们的研究小组一直在积极开发用于聚合物和有机材料的高分辨率电子光学检查的技术,尤其着重于低剂量高分辨率电子显微镜(HREM)(Martin,2000年)。尽管这种检查有机材料结构的方法已被证明特别有效,但当前的电子显微镜却存在许多问题。它们非常昂贵(通常为500,000-1,500,000美元),需要大量空间,并且非常耗时且难以操作。此外,当对由低原子序数组成的薄膜进行成像时,常规电子显微镜中通常使用的高压(200〜400 kV)几乎没有对比度。

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