Graduate School of Eng., Gunma University, 1-5-1 Tenjin, Kiryu 376-8515, Japan;
Graduate School of Eng., Gunma University, 1-5-1 Tenjin, Kiryu 376-8515, Japan;
Graduate School of Eng., Gunma University, 1-5-1 Tenjin, Kiryu 376-8515, Japan;
Graduate School of Eng., Gunma University, 1-5-1 Tenjin, Kiryu 376-8515, Japan;
Graduate School of Eng., Gunma University, 1-5-1 Tenjin, Kiryu 376-8515, Japan;
Tokyo Instrument Co. Ltd., 6-18-14 Nishikasai, Edogawa, Tokyo 134-0088, Japan;
Tokyo Instrument Co. Ltd., 6-18-14 Nishikasai, Edogawa, Tokyo 134-0088, Japan;
SNOM; near-field optical microscopy; Raman spectroscopy; stress measurement;
机译:使用光学透射光谱法,近场扫描光学显微镜和扫描开尔文探针显微镜研究GaN:Mg中的成分波动
机译:无孔扫描近场光学显微镜(aSNOM)中的等离子纳米结构
机译:硅栅的纳米分辨率应力测量,采用照明收集型扫描近场拉曼光谱仪和完全金属内涂层金字塔形探针
机译:照明收集模式扫描近场光学显微镜和拉曼光谱与金内涂层孔径的金字塔探针扫描
机译:通过定制散射型扫描近场光学显微镜获得的可变温度SiO2条纹光谱。
机译:锐金锥度本征模的k空间成像用于扫描近场光学显微镜
机译:用狭缝探针测量光磁场的近场扫描光学显微镜的导模模式