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Active pixel sensors: the sensor of choice for future space applications

机译:有源像素传感器:未来太空应用的首选传感器

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摘要

It is generally known that active pixel sensors (APS) have a number of advantages over CCD detectors if it comes to cost for mass production, power consumption and ease of integration. Nevertheless, most space applications still use CCD detectors because they tend to give better performance and have a successful heritage. To this respect a change may be at hand with the advent of deep sub-micron processed APS imagers (< 0.25-micron feature size=. Measurements performed on test structures at the University of Delft have shown that the imagers are very radiation tolerant even if made in a standard process without the use of special design rules. Furthermore it was shown that the 1/f noise associated with deep sub-micron imagers is reduced as compared to previous generations APS imagers due to the improved quality of the gate oxides. Considering that end of life performance will have to be guaranteed, limited budget for adding shielding metal will be available for most applications and lower power operations is always seen as a positive characteristic in space applications, deep sub-micron APS imagers seem to have a number of advantages over CCD's that will probably cause them to replace CCD's in those applications where radiation tolerance and low power operation are important.
机译:众所周知,如果在批量生产成本,功耗和易于集成方面,有源像素传感器(APS)相对于CCD检测器具有许多优势。尽管如此,大多数空间应用仍使用CCD检测器,因为它们往往会提供更好的性能并具有成功的传承。在这方面,深亚微米处理的APS成像仪(<0.25微米特征尺寸=)的出现可能即将到来。代尔夫特大学对测试结构进行的测量表明,即使在不使用特殊设计规则的情况下,以标准工艺制造的图像;此外,由于栅极氧化物的质量提高,与上一代APS成像仪相比,与深亚微米成像仪相关的1 / f噪声得以降低。使用寿命必须得到保证,对于大多数应用,可用有限的预算来添加屏蔽金属,并且低功率操作在太空应用中始终被视为积极的特征,深亚微米APS成像仪似乎有很多CCD的优势可能会导致它们在对辐射的承受能力和低功耗操作很重要的应用中取代CCD。

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