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Investigation of Galvanic Corrosion Characteristics between Tantalum Nitride and Poly Silicon in Dilute HF Solutions

机译:稀HF溶液中氮化钽与多晶硅之间电偶腐蚀的研究

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摘要

Galvanic corrosion characteristics between poly-Si and tantalum nitride (TaN) (area ratio 1:1 and 1:4) have been investigated in very dilute HF solutions (0.01 to 0.05%) containing controlled levels of dissolved oxygen. The increase in exposed cathode (metal) area as well as aeration results in higher corrosion of poly-Si. In de-aerated HF solutions (less than 0.5 ppm of O_2), irrespective of the area ratio, there appears to be no silicon loss. Morphological changes on poly-Si due to galvanic corrosion have been characterized using Scanning Electron Microscopy.
机译:在含有可控溶解氧水平的非常稀的HF溶液(0.01至0.05%)中,研究了多晶硅与氮化钽(TaN)(面积比1:1和1:4)之间的电偶腐蚀特性。暴露的阴极(金属)面积的增加以及充气会导致多晶硅的腐蚀。在脱气的HF溶液(O_2小于0.5 ppm)中,无论面积比如何,似乎都没有硅损失。使用扫描电子显微镜已经表征了由于电腐蚀导致的多晶硅形态变化。

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  • 来源
  • 会议地点 Boston MA(US);Boston MA(US)
  • 作者单位

    Department of Materials Science and Engineering, The University of Arizona, Tucson, AZ 85721, USA;

    Department of Materials Science and Engineering, The University of Arizona, Tucson, AZ 85721, USA;

    Department of Materials Science and Engineering, The University of Arizona, Tucson, AZ 85721, USA;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 半导体技术;
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