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LUMINESCENCE OF Ge/Si QUANTUM DOTS SUBJECTED TO RADIATION DAMAGE AND HYDROGEN PASSIVATION

机译:Ge / Si量子点受辐射损伤和氢钝化的发光

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摘要

Influence of proton irradiation and hydrogen passivation on the photoluminescence (PL) of MBE grown Ge/Si quantum dots (QDs) has been studied. An enhanced resistance of the QDs against irradiation as compared to the quantum wells and bulk silicon has been found. The passivation improves the thermal s tability of the QD luminescence whereas the irradiation reduces it. Various carrier/exciton redistribution processes among the PL centers and the influence of defects have been observed.
机译:研究了质子辐照和氢钝化对MBE生长的Ge / Si量子点(QDs)的光致发光(PL)的影响。已经发现,与量子阱和体硅相比,量子点的抗辐射性增强。钝化提高了QD发光的热稳定性,而辐射则降低了它的稳定性。在PL中心之间,各种载子/激子重分配过程以及缺陷的影响已被观察到。

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