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INTRADOT CARRIER RELAXATION IN RADIATION-DAMAGED InGaAs/GaAs QUANTUM DOT HETEROSTRUCTURES

机译:InGaAs / GaAs量子点异质结构中辐射载体的弛豫

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摘要

The influence of high-energy (2.4 MeV) proton irradiation on the photoluminescence (PL), PL excitation and time-resolved PL spectra of InGaAs/GaAs quantum dots (QDs) is reported. The effect of irradiation on the PLE spectra is mainly attributed to a Fermi level shift towards the center of the gap. TRPL measurements show an evidence of carrier tunneling out of the excited QD states to adjacent defects. The ground level remains unaffected by the defects, at least up to a certain dose. Our considerations show that the dots very probably expulse radiation defects.
机译:报道了高能(2.4 MeV)质子辐照对InGaAs / GaAs量子点(QDs)的光致发光(PL),PL激发和时间分辨PL光谱的影响。辐射对PLE光谱的影响主要归因于费米能级向间隙中心移动。 TRPL测量表明载流子从激发的QD态隧穿到相邻缺陷。至少在一定剂量下,地面不会受到缺陷的影响。我们的考虑表明,这些点很可能会消除辐射缺陷。

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