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Design and calibration of an elastically guided CMM axis with nanometer repeatability

机译:具有纳米重复性的弹性导向三坐标测量机轴的设计和校准

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This paper focuses on the on the design and calibration of an elastically guided vertical axis that will be applied in a small high precision 3D Coordinate Measuring Machine aiming a volumetric uncertainty of 25 nm. The design part of this paper discusses the principles of this system, the compensation of the stiffness of the vertical axis in the direction of motion, the weight compensation method and the design and performance of the axis precision drive system, a Lorentz actuator. In the metrology part of this paper the calibration methods to determine the linearity as well as motion straightness and axis rotation errors are discussed. Finally first calibration results of this axis show nanometer repeatability of the probing point over the 4 mm stroke of this axis. The causes of the short-term variations with a bandwidth of about ± 10 nm are under investigation. Error compensation may reduce the residual error of the probing point to the nanometer level.
机译:本文着重于弹性导向垂直轴的设计和校准,该轴将用于小型高精度3D坐标测量机,其目标体积不确定度为25 nm。本文的设计部分讨论了该系统的原理,垂直轴在运动方向上的刚度补偿,重量补偿方法以及轴精密驱动系统(洛伦兹执行器)的设计和性能。在本文的计量部分,讨论了确定线性以及运动直线度和轴旋转误差的校准方法。最终,该轴的第一个校准结果显示了该轴4 mm行程上探测点的纳米重复性。正在研究带宽大约为±10 nm的短期变化的原因。误差补偿可以将探测点的残留误差减小到纳米水平。

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