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Laser annealing of implanted Semiconductor layers - one bridge to Nano-processirtg

机译:植入半导体层的激光退火-通往纳米工艺的一座桥梁

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About 25years after inventing the laser annealing effects of ion implanted semiconductors a summary of the related physical phenomena is given; The field of application for short and selectively deposited energy pulses in controlled thermally activated processing is critically reviewed with the emphasis on electrical activation of implanted layers. Starting form the energy deposition and continuing to the excited transport phenomena a set of regimes can be described; which allows the classification of the variety of laser annealing methods and their different application. Within the scope of controlled thermally activated processes in nanometer dimensions old phenomena like phase transitions in strong non-equilibrium to create metastable states or producing dissipative structures by nonlinear coupling effects with self-organization are taken into account for device generations beyond 45nm. The challenges and disadvantages of laser annealing methods for planar semiconductor technology will be elaborated with respect to the current progress in laser development.
机译:在发明了离子注入半导体的激光退火效应后约25年,对相关的物理现象进行了总结。在受控的热激活处理中,针对短且选择性沉积的能量脉冲的应用领域进行了严格审查,重点是注入层的电激活。从能量沉积开始,一直到激发的输运现象,可以描述一系列机制。从而可以对各种激光退火方法及其不同的应用进行分类。在纳米级受控热激活过程的范围内,对于超过45nm的器件世代,已考虑到了诸如强非平衡中的相变以产生亚稳态或通过自组织的非线性耦合效应产生耗散结构等旧现象。将针对激光开发的当前进展阐述用于平面半导体技术的激光退火方法的挑战和缺点。

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