首页> 外国专利> LASER ANNEALING METHOD FOR SEMICONDUCTOR DEVICE, SEMICONDUCTOR DEVICE, LASER ANNEALING METHOD, CONTROL DEVICE OF LASER ANNEALING APPARATUS, AND LASER ANNEALING APPARATUS

LASER ANNEALING METHOD FOR SEMICONDUCTOR DEVICE, SEMICONDUCTOR DEVICE, LASER ANNEALING METHOD, CONTROL DEVICE OF LASER ANNEALING APPARATUS, AND LASER ANNEALING APPARATUS

机译:激光退火方法,用于半导体器件,半导体器件,激光退火方法,激光退火装置的控制装置和激光退火装置

摘要

A laser annealing method for a semiconductor device, includes: a first step of adding an impurity to a semiconductor substrate; and a second step of irradiating a region to which the impurity is added with a pulsed laser beam a plurality of times to anneal the semiconductor substrate. In the second step, a first region of a portion of the region to which the impurity is added is irradiated with the pulsed laser beam, and after a predetermined time interval, a second region adjacent to the first region is irradiated with the pulsed laser beam. The predetermined time interval is larger than a pulse interval of the pulsed laser beam.
机译:一种用于半导体器件的激光退火方法,包括:将杂质添加到半导体衬底的第一步骤;和多次向脉冲激光束添加杂质的区域的第二步骤多次以退火以退火半导体衬底。在第二步骤中,用脉冲激光束照射添加杂质的区域的一部分区域的第一区域,并且在预定的时间间隔之后,用脉冲激光束照射与第一区域相邻的第二区域。预定时间间隔大于脉冲激光束的脉冲间隔。

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