Research Institute for Electronic Science, Hokkaido University, sapporo 001-0021, JAPAN The Institute of Scientific and Industrial Research, Osaka University, Ibaraki, Osaka 567-0047, JAPAN;
rnResearch Institute for Electronic Science, Hokkaido University, sapporo 001-0021, JAPAN The Institute of Scientific and Industrial Research, Osaka University, Ibaraki, Osaka 567-0047, JAPAN;
rnResearch Institute for Electronic Science, Hokkaido University, sapporo 001-0021, JAPAN;
rnResearch Institute for Electronic Science, Hokkaido University, sapporo 001-0021, JAPAN The Institute of Scientific and Industrial Research, Osaka University, Ibaraki, Osaka 567-0047, JAPAN;
C-NOT gate; error analysis; process matrix; process fidelity;
机译:基于嵌入在双面光学腔中的原子合奏的鲁棒确定型控制阶段翻转栅极和控制非栅极
机译:量子点-微腔耦合系统中自旋量子位的光控相位门和受控NOT门的传送
机译:量子点-微腔耦合系统中自旋量子位的光控相位门和非受控门的隐形传态
机译:光学控制非栅极中的错误分析
机译:使用统计方法的短期风电预测误差分析---通过海上空间平滑效应减少区域性总风电预测误差的研究。
机译:基于二次激活门系统的微波激活相(MAP)门构造可控NOT门
机译:光控相位门和远程控制的受控NOT 量子点 - 微腔耦合系统中自旋量子位的门