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Analysis of Errors in an Optical Controlled-NOT Gate

机译:光控非门的误差分析

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摘要

The errors in linear optics controlled not (C-NOT) gates are analyzed considering the polarization-dependent phase sifts, in addition to the incorrectness of the beam splitting ratios. It is shown that the phase sifts at the optical components is as crucial as other error sources discussed in the previous studies. Such a phase shift unintentionally changes the linearly-polarized photons into a elliptically polarized ones. The operators for a beam splitting device and the process matrix of the C-NOT operation including such errors are also given.
机译:除了分束比的不正确性之外,还考虑了偏振相关的相位漂移,分析了线性光学控制非(C-NOT)门的误差。结果表明,光学元件的相位漂移与先前研究中讨论的其他误差源同样重要。这样的相移无意地将线性偏振光子改变为椭圆偏振光子。还给出了分束器的运算符以及包括这种误差在内的C-NOT操作的过程矩阵。

著录项

  • 来源
    《Quantum communications and quantum imaging VII 》|2009年|P.746513.1-746513.7|共7页
  • 会议地点 San Diego CA(US)
  • 作者单位

    Research Institute for Electronic Science, Hokkaido University, sapporo 001-0021, JAPAN The Institute of Scientific and Industrial Research, Osaka University, Ibaraki, Osaka 567-0047, JAPAN;

    rnResearch Institute for Electronic Science, Hokkaido University, sapporo 001-0021, JAPAN The Institute of Scientific and Industrial Research, Osaka University, Ibaraki, Osaka 567-0047, JAPAN;

    rnResearch Institute for Electronic Science, Hokkaido University, sapporo 001-0021, JAPAN;

    rnResearch Institute for Electronic Science, Hokkaido University, sapporo 001-0021, JAPAN The Institute of Scientific and Industrial Research, Osaka University, Ibaraki, Osaka 567-0047, JAPAN;

  • 会议组织
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 信息处理(信息加工) ;
  • 关键词

    C-NOT gate; error analysis; process matrix; process fidelity;

    机译:C-NOT门;错误分析;工艺矩阵流程保真度;

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