Non-destructive characterisation of vertical ZnO nanorod arrays by slow positron implantation spectroscopy, atomic force microscopy, and photoluminescence

摘要

ZnO is of considerable interest for optoelectronic device applications due to its wide band gap and high exciton binding energy. Among various fabrication methods available for ZnO nanostructures, hydrothermal synthesis is of the greatest interest due to its low fabrication temperature and low cost. Such ZnO nanorods have already been successfully characterized by slow positron implantation spectroscopy (SPIS) and atomic force microscopy (AFM) [1]. However, the material quality of rods grown this way is often inferior to vapour deposited samples.