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Low-temperature characteristics of In0.7Ga0.3As PHEMTs

机译:In0.7Ga0.3As PHEMT的低温特性

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摘要

In this paper, we report on temperature dependent DC characteristics of In0.7Ga0.3As Pseudomorphic-HEMTs (PHEMTs) on InP substrate. First, we have fabricated the In0.7Ga0.3As PHEMTs with various values of Lg, ranging from 10 μm to 2.5 μm. The fabricated device with Lg = 2.5 μm exhibits excellent subthreshold-swing (SS) of 64 mV/decade at room temperature. Note that this is close to 60 mV/decade, which is a theoretical limit at room temperature in a FET configuration. Next, we have measured current-voltage characteristics at various values of temperatures, from 300 K to 80 K. Finally, we have investigated the temperature-dependent DC characteristics of the In0.7Ga0.3As PHEMTs, in terms of output, subthreshold, and transconductance characteristics.
机译:在本文中,我们报告了InP衬底上In0.7Ga0.3As假晶HEMT(PHEMT)的温度依赖性直流特性。首先,我们制造了In0.7Ga0.3As PHEMT,其Lg值从10μm到2.5μm不等。 Lg = 2.5μm的制造器件在室温下表现出出色的亚阈值摆幅(SS),为64 mV /十年。请注意,这接近60 mV /十倍,这是FET配置在室温下的理论极限。接下来,我们在300 K至80 K的各种温度值下测量了电流-电压特性。最后,我们研究了In0.7Ga0.3As PHEMT的温度依赖性直流特性,包括输出,亚阈值和跨导特性。

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